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A Distributed Architecture to Check Global Properties for Post-Silicon Debug
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
NXP Semiconductors.
Eindhoven University of Technology.
2010 (English)In: IEEE European Test Symposium (ETS'10), Prague, Czech Republic, May 24-28, 2010., IEEE , 2010, 182-187 p.Conference paper (Refereed)
Abstract [en]

Post-silicon validation and debug, or ensuring that software executes correctly on the silicon of a multi-processor system-on-chip (MPSOC) is complicated, as it involves checking global properties that are distributed on the chip. In this paper we define an architecture to non-intrusively observe global properties at run time using distributed monitors. The architecture enables to perform actions when a property holds, such as stopping (part of) the system for inspection. We apply this architecture to the problem of software races that result in incorrect communication between concurrent tasks on different processors. In a case study, where we implemented monitors, event distribution, and instruments to stop communication between intellectual property (IP) blocks, we demonstrate that these races can be detected and classified as timing violations or as FIFO protocol violations.

Place, publisher, year, edition, pages
IEEE , 2010. 182-187 p.
National Category
Engineering and Technology
URN: urn:nbn:se:liu:diva-59607DOI: 10.1109/ETSYM.2010.5512760ISBN: 978-1-4244-5833-2 (online)ISBN: 978-1-4244-5834-9 (print)OAI: diva2:352631
2010 15th IEEE European Test Symposium, ETS'10; Prague; Czech Republic

©2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. Erik Larsson, Bart Vermeulen and Kees Goossens, A Distributed Architecture to Check Global Properties for Post-Silicon Debug, 2010, IEEE European Test Symposium (ETS'10), Prague, Czech Republic, May 24-28, 2010.

Available from: 2010-09-29 Created: 2010-09-21 Last updated: 2014-09-25Bibliographically approved

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