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XPS characterization of tungsten based contact layers on 4H-SiC
Bulgarian Academy of Sciences, Sofia.
Bulgarian Academy of Sciences, Sofia.
Thomson-CSF/LCR, Orsay Cedex, France.
Thomson-CSF/LCR, Orsay Cedex, France.
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1999 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 337, no 1-2, 180-183 p.Article in journal (Refereed) Published
Abstract [en]

Annealed W (WN)/4H–SiC interfaces have been compared on the basis of X-ray photoelectron spectroscopy (XPS) studies. The 1200°C annealed W (WN)/4H–SiC structures are characterized by intense interface reactions leading to tungsten carbide and tungsten silicide formation in the contact layers. The 800°C annealed WN/4H–SiC structure exhibits a chemically inert interface, and the 800°C annealed WN/4H–SiC contact is found to be of a Schottky type with a barrier height of 0.94 eV and an ideality coefficient of 1.09.

Place, publisher, year, edition, pages
1999. Vol. 337, no 1-2, 180-183 p.
Keyword [en]
X-ray photoelectron spectroscopy; Interface reaction; WN/SiC structure
National Category
Natural Sciences
URN: urn:nbn:se:liu:diva-62868DOI: 10.1016/S0040-6090(98)01199-7OAI: diva2:374914
Available from: 2010-12-06 Created: 2010-12-06 Last updated: 2011-01-13

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Kakanakova-Georgieva, Anelia
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