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Study of electric field enhanced emission rates of an electron trap in n-type GaN grown by hydride vapor phase epitaxy
Radboud University Nijmegen.
Islamia University Bahawalpur.
Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
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2010 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 108, no 10Article in journal (Refereed) Published
Abstract [en]

Electric field-enhanced emission of electrons from a deep level defect in GaN grown by hydride vapor phase epitaxy has been studied. Using the field dependent mode of conventional deep level transient spectroscopy (DLTS), several frequency scans were performed keeping applied electric field (12.8-31.4 MV/m) and sample temperature (300-360 K) constant. Arrhenius plots of the resultant data yielded an activation energy of the electron trap E ranging from E-c -0.48 +/- 0.02 eV to E-c-0.35 +/- 0.02 eV, respectively. The extrapolation of the as-measured field dependent data (activation energy) revealed the zero-field emission energy (pure thermal activation energy) of the trap to be 0.55 +/- 0.02 eV. Various theoretical models were applied to justify the field-enhanced emission of the carriers from the trap. Eventually it was found that the Poole-Frenkel model associated with a square well potential of radius r=4.8 nm was consistent with the experimental data, and, as a result, the trap is attributed to a charged impurity. Earlier, qualitative measurements like current-voltage (I-V) and capacitance-voltage (C-V) measurements were performed, and screening parameters of the device were extracted to ascertain the reliability of DLTS data.

Place, publisher, year, edition, pages
American Institute of Physics , 2010. Vol. 108, no 10
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Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-63959DOI: 10.1063/1.3499669ISI: 000285005000073OAI: oai:DiVA.org:liu-63959DiVA: diva2:384496
Note
Original Publication: H. Ashraf, M. Imran Arshad, Sadia Muniza Faraz, Qamar Ul Wahab, P. R. Hageman and M. Asghar, Study of electric field enhanced emission rates of an electron trap in n-type GaN grown by hydride vapor phase epitaxy, 2010, Journal of Applied Physics, (108), 10, 103708. http://dx.doi.org/10.1063/1.3499669 Copyright: American Institute of Physics http://www.aip.org/ Available from: 2011-01-10 Created: 2011-01-10 Last updated: 2017-12-11

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Muniza Faraz, SadiaUl Wahab, Qamar

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