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Measurement Point Selection for In-Operation Wear-Out Monitoring
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, Faculty of Educational Sciences.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
2011 (English)In: 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS11), Cottbus, Germany, April 13-15, 2011., IEEE , 2011, 381-386 p.Conference paper, Published paper (Refereed)
Abstract [en]

In recent IC designs, the risk of early failure due to electromigration wear-out has increased due to reduced feature dimensions. To give a warning of impending failure, wearout monitoring approaches have included delay measurement circuitry on-chip. Due to the high cost of delay measurement circuitry this paper presents a method to reduce the number of necessary measurement points. The proposed method is based on identification of wear-out sensitive interconnects and selects a small number of measurement points that can be used to observe the state of all the wear-out sensitive interconnects. The method is demonstrated on ISCAS85 benchmark ICs with encouraging results.

Place, publisher, year, edition, pages
IEEE , 2011. 381-386 p.
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-66349DOI: 10.1109/DDECS.2011.5783115ISBN: 978-1-4244-9755-3 (print)OAI: oai:DiVA.org:liu-66349DiVA: diva2:403343
Conference
14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011; Cottbus; Germany
Available from: 2011-03-11 Created: 2011-03-11 Last updated: 2014-10-21Bibliographically approved

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Ingelsson, UrbanChang, Shih-YenLarsson, Erik

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Ingelsson, UrbanChang, Shih-YenLarsson, Erik
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ESLAB - Embedded Systems LaboratoryThe Institute of TechnologyFaculty of Educational Sciences
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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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  • Other style
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  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
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  • asciidoc
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