Mapping of Local Electrical Properties in Epitaxial Graphene Using Electrostatic Force Microscopy
2011 (English)In: NANO LETTERS, ISSN 1530-6984, Vol. 11, no 6, 2324-2328 p.Article in journal (Refereed) Published
Local electrical characterization of epitaxial graphene grown on 4H-SiC (0001) using electrostatic force microscopy (EFM) in ambient conditions and at elevated temperatures is presented. EFM provides a straightforward identification of graphene with different numbers of layers on the substrate where topographical determination is hindered by adsorbates. Novel EFM spectroscopy has been developed measuring the EFM phase as a function of the electrical DC bias, establishing a rigorous way to distinguish graphene domains and facilitating optimization of EFM imaging.
Place, publisher, year, edition, pages
American Chemical Society , 2011. Vol. 11, no 6, 2324-2328 p.
Epitaxial graphene, electrostatic force microscopy, phase contrast, surface potential
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-69168DOI: 10.1021/nl200581gISI: 000291322600022OAI: oai:DiVA.org:liu-69168DiVA: diva2:424338