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Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, Department of Computer and Information Science, Software and Systems. Linköping University, The Institute of Technology.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Ericsson, Linköping, Sweden.
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2011 (English)In: Proceedings of the Asian Test Symposium, IEEE , 2011, 525-531 p.Conference paper, Published paper (Refereed)
Abstract [en]

In contrast to IEEE 1149.1, IEEE P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measurement and configuration features. Flexible access to embedded instruments allows test time reduction, which is important at production test. However, the test access scheme should be carefully selected such that resource constraints are not violated and power constraints are met. For IEEE P1687, we detail in this paper session-based and session-less test scheduling, and propose resource and power-aware test scheduling algorithms for the detailed scheduling types. Results using the implementation of our algorithms shows on ITC’02-based benchmarks significant test time reductions when compared to non-optimized test schedules.

Place, publisher, year, edition, pages
IEEE , 2011. 525-531 p.
Series
Proceedings of the Asian Test Symposium, ISSN 1081-7735
National Category
Engineering and Technology Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-70033DOI: 10.1109/ATS.2011.80ISBN: 978-1-4577-1984-4 (print)OAI: oai:DiVA.org:liu-70033DiVA: diva2:434604
Conference
20th Asian Test Symposium, ATS 2011; New Delhi; India
Available from: 2011-08-15 Created: 2011-08-15 Last updated: 2014-10-16

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Zadegan, Farrokh Ghani

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf