Calibration of sigma-delta analog-to-digital converters based on histogram test methods
2010 (English)In: NORCHIP, 2010, IEEE , 2010, 1-4 p.Conference paper (Refereed)
In this paper we present a calibration technique for sigma-delta analog-to-digital converters (ΣΔADC) in which highspeed, low-resolution flash subADCs are used. The calibration technique as such is mainly targeting calibration of the flash subADC, but we also study how the correction depends on where in the ΣΔ modulator the calibration signals are applied. It is shown that the calibration technique can cope with errors that occur in the feedback digital-to-analog converter (DAC) and the input accumulator. Behavioral-level simulation results show an improvement of in effective number of bits (ENOB) from 6.6 to 11.3. Fairly large offset and gain errors have been introduced which illustrates a robust calibration technique.
Place, publisher, year, edition, pages
IEEE , 2010. 1-4 p.
#x03A3; #x0394; analog-to-digital converters;calibration technique;feedback digital-to-analog converter;histogram test methods;low-resolution flash subADCs;sigma-delta analog-to-digital converters;calibration;feedback;sigma-delta modulation;
National CategoryOther Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:liu:diva-70627DOI: 10.1109/NORCHIP.2010.5669459ISBN: 978-1-4244-8972-5OAI: oai:DiVA.org:liu-70627DiVA: diva2:440975
NorChip 2010, 28th Norchip Conference, 15 - 16 November 2010, Tampere, Finland