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Modeling of CMOS digital-to-analog converters for telecommunication
Linköping University, Department of Electrical Engineering, Electronics System. Linköping University, The Institute of Technology.
Linköping University, Department of Electrical Engineering, Electronics System. Linköping University, The Institute of Technology.
1999 (English)In: IEEE transactions on circuits and systems. 2, Analog and digital signal processing (Print), ISSN 1057-7130, E-ISSN 1558-125X, Vol. 46, no 5, 489-499 p.Article in journal (Refereed) Published
Abstract [en]

This paper gives an overview of some of the effects caused by circuit mismatch and parasitics in binary weighted digital-to-analog converters (DACs), and, as a special case, a current-steering CMOS converter. Matlab is used as a behavior-level simulator. In telecommunications applications, the frequency-domain parameters are of the greatest importance. Therefore, the characterization of the device and its performance is determined by frequency parameters such as the signal-to-noise ratio, spurious-free dynamic range, multitone power ratio, etc. In this paper, we show how these frequency-domain parameters are affected when mismatch errors and finite output impedance are applied to a current-steering CMOS DAC. We discuss how static performance is affected when changing the size of the errors and fundamental circuit parameters. The impact of dynamic errors such as glitches, slewing, and bit skew is discussed. Measurement results from 14-bit DACs are also shown to illustrate the correlation with the modeling.

Place, publisher, year, edition, pages
IEEE , 1999. Vol. 46, no 5, 489-499 p.
Keyword [en]
14 bit;CMOS DAC;Matlab;SNR;behavior-level simulator;binary weighted DAC;bit skew;circuit mismatch;current-steering CMOS converter;digital-to-analog converters;dynamic errors;finite output impedance;frequency-domain parameters;fundamental circuit parameters;glitches;modeling;multitone power ratio;parasitics;signal-to-noise ratio;slewing;spurious-free dynamic range;static errors;static performance;telecommunications applications;CMOS integrated circuits;circuit simulation;digital-analogue conversion;errors;telecommunication equipment;
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:liu:diva-70610DOI: 10.1109/82.769797OAI: oai:DiVA.org:liu-70610DiVA: diva2:440998
Available from: 2011-09-14 Created: 2011-09-14 Last updated: 2017-12-08

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Wikner, Jacob

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