liu.seSearch for publications in DiVA
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Performance Characterization of a Silicon Strip Detector for Spectral Computed Tomography Utilizing a Laser Testing System
Royal Institute of Technology (Sweden).
Royal Institute of Technology (Sweden).
Royal Institute of Technology (Sweden).
Royal Institute of Technology (Sweden).
Show others and affiliations
2011 (English)In: Proc. SPIE, SPIE - International Society for Optical Engineering, 2011Conference paper, Published paper (Refereed)
Abstract [en]

A new silicon strip detector with sub-millimeter pixel size operated in single photon-counting mode has been developed for use in spectral computed tomography (CT). An ultra fast application specific integrated circuit (ASIC) specially designed for fast photon-counting application is used to process the pulses and sort them into eight energy bins. This report characterizes the ASIC and detector in terms of thermal noise (0.77 keV RMS), energy resolution when electron-hole pairs are generated in the detector diode (1.5 keV RMS) and Poissonian count rate with retained count rate linearity and energy resolution (200 Mcps•mm-2). The performance of the photon-counting detector has been tested using a picosecond pulsed laser system to inject energy into the detector, simulating x-ray interactions. The laser testing results indicate a good energy-discriminating capability of the detector, assigning the pulses to higher and higher energy bins as the intensity of the laser pulses are increased.

Place, publisher, year, edition, pages
SPIE - International Society for Optical Engineering, 2011.
Series
Proceedings of SPIE, the International Society for Optical Engineering, ISSN 0277-786X
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:liu:diva-73033DOI: 10.1117/12.872867ISBN: 0819485039 (print)ISBN: 9780819485038 (print)ISBN: 9780819485038 (print)OAI: oai:DiVA.org:liu-73033DiVA: diva2:465007
Conference
SPIE, Lake Buena Vista, Florida, 13 February 2011
Available from: 2011-12-14 Created: 2011-12-14 Last updated: 2013-12-03

Open Access in DiVA

No full text

Other links

Publisher's full text

Authority records BETA

Svensson, Christer

Search in DiVA

By author/editor
Svensson, Christer
By organisation
Electronic DevicesThe Institute of Technology
Electrical Engineering, Electronic Engineering, Information Engineering

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 87 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf