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X-ray diffraction from amorphous Ge/Si Cantor superlattices
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.ORCID iD: 0000-0003-2749-8008
Institute for Physics and Technology of Materials, Bucharest-Magurele, Romania.
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
1995 (English)In: Physical Review B Condensed Matter, ISSN 0163-1829, E-ISSN 1095-3795, Vol. 51, no 12, 7621-7631 p.Article in journal (Refereed) Published
Abstract [en]

X-ray measurements on Cantor superlattices are reported. Indexing and scaling laws are derived for the distribution of peaks in the diffraction spectra of perfect superlattices. The peaks are indexed by three indices and the largest scaling exponents of the intensities are proportional to the fractal dimensions of the Cantor sets. The theoretical indexing scheme of the peaks is confirmed by experiment. The influence of the absorption and sample imperfections on the scaling of the peaks is investigated by means of numerical simulations. A discussion of the nature of the diffraction spectra in the thermodynamic limit is also included.

Place, publisher, year, edition, pages
American Physical Society , 1995. Vol. 51, no 12, 7621-7631 p.
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:liu:diva-76383DOI: 10.1103/PhysRevB.51.7621OAI: oai:DiVA.org:liu-76383DiVA: diva2:514199
Available from: 2012-04-05 Created: 2012-04-05 Last updated: 2017-12-07

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Järrendahl, KennethBirch, Jens

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