Test Planning for 3D Stacked ICs with Through-Silicon Vias
2011 (English)In: 3D-TEST, 2011Conference paper (Refereed)
Test planning for core-based 3D stacked ICs with trough-silicon vias (3D TSV-SIC) is different from test planning for non-stacked ICs as the same test schedule cannot be applied both at wafer sort and package test. In this paper, we assume a test flow where each chip is tested individually at wafer sort and jointly at package test. We define cost functions and test planning optimization algorithms for non-stacked ICs and 3D TSV-SICs with two chips in the stack. We have implemented our techniques and experiments show significant reduction of test cost.
Place, publisher, year, edition, pages
Computer and Information Science
IdentifiersURN: urn:nbn:se:liu:diva-77287OAI: oai:DiVA.org:liu-77287DiVA: diva2:526213
2nd IEEE Intl. Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST), Anaheim, CA, USA, September 22-23, 2011