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Structural investigation of substoichiometry and solid solution effects in Ti2Al(C-x,N1-x)(y) compounds
University of Poitiers.
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.ORCID iD: 0000-0003-1785-0864
University of Poitiers.
University of Poitiers.
2012 (English)In: Journal of the European Ceramic Society, ISSN 0955-2219, Vol. 32, no 8, 1803-1811 p.Article in journal (Refereed) Published
Abstract [en]

The milling, cold compaction and thermal annealing (4 h-1400 degrees C-Ar flow) of Ti, TiC, Al and AlN powders were used to produce Ti2Al(CxN(1-x))(y) compounds with x = 0, 0.25, 0.5, 0.75, 1 and 0.7 andlt;= y andlt;= 1. X-ray diffraction analysis, scanning electron microscopy observations combined with microanalysis confirmed the formation of the almost pure Ti(2)A/CxN(1-x) carbonitrides for y=1 whereas increasing amounts of titanium aluminides were formed when y decreases. Proportions of the different phases deduced from Rietveld refinements of the X-ray diffractograms indicate that no or very poor substoichiometry in carbon was possible in carbide whereas C and N deficiency can be achieved in nitrides and carbonitrides Ti2AlCxN(1-x). Electron Energy Loss Spectroscopy investigations confirm that carbonitrides can have at least 20% of vacancies on the C or N site. The a lattice parameter varies linearly with x whereas it is not the case for the c lattice parameter, its values being lower for the carbonitrides. Furthermore, a strong broadening of the carbonitrides XRD peaks is observed, a phenomenon that can be mainly attributed to C and N concentration gradients inside the samples.

Place, publisher, year, edition, pages
Elsevier , 2012. Vol. 32, no 8, 1803-1811 p.
Keyword [en]
Sintering, X-ray methods, Carbides, Nitrides, MAX phase
National Category
Engineering and Technology
URN: urn:nbn:se:liu:diva-77516DOI: 10.1016/j.jeurceramsoc.2011.12.011ISI: 000303279600036OAI: diva2:528617
Funding Agencies|University of Poitiers||Available from: 2012-05-28 Created: 2012-05-22 Last updated: 2015-01-13

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Eklund, Per
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