Preliminary evaluation of a silicon strip detector for photon-counting spectral CT
2012 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, Vol. 677, 45-51 p.Article in journal (Refereed) Published
An edge-on silicon strip detector designed for photon-counting spectral computed tomography (CT) is presented. Progress on the development of an application specific integrated circuit (ASIC) to process the pulses and sort them into energy bins is reported upon. The ASIC and detector are evaluated in terms of electronic noise, energy resolution, count rate linearity under high-frequency periodic pulses, threshold variation and gain. The high-frequency periodic pulses are injected both by means of an external pulse generator and a pulsed laser illuminating the silicon diode. The pulsed laser system has similar to 100 ps pulse width and thus generates near instantaneous pulses in the diode, thus mimicking real X-ray conversions. less thanbrgreater than less thanbrgreater thanThe evaluation shows a low thermal noise level of 0.77 key RMS, an energy resolution of 1.5 keV RMS when electron-hole pairs are generated in the detector diode by the laser injection. The test results furthermore indicate a good energy-discriminating capability of the detector with the thresholds spread out, assigning the external pulses to higher and higher energy bins as the pulse intensity is increased.
Place, publisher, year, edition, pages
Elsevier , 2012. Vol. 677, 45-51 p.
Photon counting, Silicon strip detector, ASIC, Spectral computed tomography, Laser test
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-77854DOI: 10.1016/j.nima.2012.02.034ISI: 000303790500010OAI: oai:DiVA.org:liu-77854DiVA: diva2:529733