liu.seSearch for publications in DiVA
Change search
ReferencesLink to record
Permanent link

Direct link
Nanowire Reconstruction on the 4H-SiC(1-102) Surface
Max-Planck-Institut für Festkörperforschung, Stuttgart, Germany.
Max-Planck-Institut für Festkörperforschung, Stuttgart, Germany.
Dept. of Physics and Astronomy, University of Pittsburgh, USA.
Max-Planck-Institut für Festkörperforschung, Stuttgart, Germany.
2007 (English)In: Silicon Carbide and Related Materials 2006 / [ed] N. Wright, C.M. Johnson, K. Vassilevski, I. Nikitina and A. Horsfall, Trans Tech Publications Inc., 2007, Vol. 556-557, 529-532 p.Conference paper (Refereed)
Abstract [en]

Ordered reconstruction phases on the 4H-SiC(1102) surface have been investigated usinglow-energy electron diffraction (LEED), Auger electron spectroscopy (AES) and scanning tunnelingmicroscopy (STM). After initial hydrogen etching, the samples were prepared by Si deposition andannealing in ultra-high vacuum (UHV). Two distinct reconstruction phases develop upon annealing,first with a (2×1), and at higher temperatures with a c(2×2) LEED pattern. After further annealingthe fractional order LEED spots vanish and a (1x1) pattern develops. For the (2×1) phase, STMmicrographs show that adatom chains develop on large flat terraces, which in view of AES consistof additional Si. These highly linear and equidistant chains represent a self-assembled well-orderedpattern of nanowires developing due to the intrinsic structure of the 4H-SiC(1102) surface. For thec(2×2) phase AES indicates a surface composition close to the bulk stoichiometry. For the (1×1)phase a further Si depletion is observed.

Place, publisher, year, edition, pages
Trans Tech Publications Inc., 2007. Vol. 556-557, 529-532 p.
, Materials Science Forum, ISSN 0255-5476 ; Vol. 556-557
Keyword [en]
Surface structure, Reconstruction, Nanowire, 4H-SiC, SiC(1102), Low-Energy Electron Diffraction, Scanning Tunneling Microscopy, Auger Electron Spectroscopy, LEED, AES, STM, One-dimensional electronic state.
National Category
Engineering and Technology
URN: urn:nbn:se:liu:diva-78524DOI: 10.4028/ 000249653900126OAI: diva2:533722
6th European Conference on Silicon Carbide and Related Materials (ECSCRM2006), Newcastle upon Tyne, ENGLAND, SEP, 2006
Available from: 2012-06-14 Created: 2012-06-14 Last updated: 2012-08-27Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full text

Search in DiVA

By author/editor
Virojanadara, Chariya
Engineering and Technology

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Altmetric score

Total: 52 hits
ReferencesLink to record
Permanent link

Direct link