Self-organized Nanostructuring in Zr0.64Al0.36N Thin Films Studied by Atom Probe Tomography
2016 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, 233-238 p.Article in journal (Refereed) Published
We have applied atom probe tomography (apt) to analyze the selforganized structure of wear-resistant Zr0.64Al0.36N thin films grown by magnetron sputtering. Transmission electron microscopy shows that these films grow as a two-dimensional nanocomposite, consisting of interleaved lamellae in a labyrinthine structure, with a size scale of ∼ 5 nm. The structure was recovered in the Al apt signal, while the Zr and N data lacked structural information due to severe local magnification effects. The onset of the self-organized growth was observed to occur locally by nucleation, at 5-8 nm from the MgO substrate, after increasing Zr-Al compositional fluctuations. Finally, it was observed that the self-organized growth mode could be perturbed by renucleation of ZrN.
Place, publisher, year, edition, pages
Elsevier, 2016. 233-238 p.
IdentifiersURN: urn:nbn:se:liu:diva-84258DOI: 10.1016/j.tsf.2016.07.034ISI: 000381939700037OAI: oai:DiVA.org:liu-84258DiVA: diva2:558393
Funding agencies: VINN Excellence Center on Functional Nanoscale Materials; Swedish Research Council; Swedish Government Strategic Faculty Grant in Materials Science (SFO Mat-LiU) at Linkoping University; Swedish Governmental Agency for Innovation Systems (Vinnova) [2011-0
Vid tiden för disputationen förelåg publikationen som manuskript2012-10-032012-10-032016-09-26Bibliographically approved