Robust Fault Isolation With Statistical Uncertainty in Identified Parameters
2012 (English)In: IEEE Transactions on Signal Processing, ISSN 1053-587X, E-ISSN 1941-0476, Vol. 60, no 10, 5556-5561 p.Article in journal (Refereed) Published
This correspondence is a companion paper to [J. Dong, M. Verhaegen, and F. Gustafsson, "Robust Fault Detection With Statistical Uncertainty in Identified Parameters," IEEE Trans. Signal Process., vol. 60, no. 10, Oct. 2012], extending it to fault isolation. Also, here, use is made of a linear in the parameters model representation of the input-output behavior of the nominal system (i.e. fault-free). The projection of the residual onto directions only sensitive to individual faults is robustified against the stochastic errors of the estimated model parameters. The correspondence considers additive error sequences to the input and output quantities that represent failures like drift, biased, stuck, or saturated sensors/actuators.
Place, publisher, year, edition, pages
IEEE Signal Processing Society, 2012. Vol. 60, no 10, 5556-5561 p.
Additive faults, Closed-form solution, Fault isolation, Parameter uncertainty, Statistical analysis
IdentifiersURN: urn:nbn:se:liu:diva-84882DOI: 10.1109/TSP.2012.2208639ISI: 000308963300046OAI: oai:DiVA.org:liu-84882DiVA: diva2:564020