Structural, free-charge carrier and phonon properties of zinc-blende and wurtizte polymorphs in InN epitaxial layers
(English)Manuscript (preprint) (Other academic)
We present a comprehensive study of the structural, phonon and free electron properties of zincblende InN films containing inclusion of wurtzite InN. Appropriate methods based on X-ray diffraction and Infrared spectroscopic ellipsometry to identify wurtizte and zinc-blende InN and quantify their phase ratio are developed and discussed. Thorough analysis on the formation of the cubic and wurtzite phases is presented and their evolution with film thickness is discussed in detail. The freecharge carrier and phonon properties of the two phases are discussed together with the determination of electron accumulation at the zinc-blende InN (001) and wurtzite (10̅11) surfaces.
IdentifiersURN: urn:nbn:se:liu:diva-85554OAI: oai:DiVA.org:liu-85554DiVA: diva2:571576