Wideband RF Detector Design for High Performance On-Chip Test
2012 (English)In: NORCHIP 2012, IEEE , 2012, 1-4 p.Conference paper (Refereed)
A wideband, high dynamic range RF amplitude detector design aimed at on-chip test is presented. Boosting gain and sub-ranging techniques are applied to the detection circuit to increase gain over the full range of input amplitudes without compromising the input impedance. Followed by a variable gain amplifier (VGA) and a 9-bit A/D converter the RF detector system, designed in 65 nm CMOS, achieves in simulation the minimum detectable signal of -58 dBm and 63 dB dynamic range over 0.5 GHz - 9 GHz band with input impedance larger than 4 kΩ. The detector is intended for on-chip calibration and the attained specifications put it among the reported state-of-the-art solutions.
Place, publisher, year, edition, pages
IEEE , 2012. 1-4 p.
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:liu:diva-86345DOI: 10.1109/NORCHP.2012.6403140ISBN: 978-1-4673-2222-5 (online)ISBN: 978-1-4673-2221-8 (print)OAI: oai:DiVA.org:liu-86345DiVA: diva2:576623
IEEE NORCHIP 2012, 12-13 November 2012, Copenhagen, Denmark