Microstructural evolution of sol-gel derived ZnO thin films
2010 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 518, no 23, 6792-6798 p.Article in journal (Refereed) Published
Zinc oxide thin films, with thicknesses between ∼ 20 and 450 nm, were prepared by spin-coating a sol–gel precursor solution (zinc acetate dihydrate and monoethanolamine in an isopropanol solvent) onto glass substrates, followed by heat treatment at temperatures through 773 K. At 298 and 373 K, the films exhibited the structure of a lamellar ZnO precursor, Layered Basic Zinc Acetate (LBZA). At higher temperatures, LBZA released intercalated water and acetate groups and dehydroxylated to form zinc oxide nanograins with wurtzite structure, which were preferentially oriented in the c-axis direction. Both the degree of the films' c-axis orientation and the topography of their surfaces varied with heat treatment and precursor concentration. For films calcined at 773 K, a minimum of micron-scale surface wrinkles coincided with a maximum in c-axis preference at intermediate concentrations, suggesting that release of mechanical stress during densification of thicker films may have disrupted the ordering process that occurs during heat treatment.
Place, publisher, year, edition, pages
Elsevier, 2010. Vol. 518, no 23, 6792-6798 p.
Zinc oxide; Thin films; Sol–gel; X-ray diffraction; Scanning electron microscopy; Surface morphology; Annealing
Materials Engineering Physical Sciences
IdentifiersURN: urn:nbn:se:liu:diva-88525DOI: 10.1016/j.tsf.2010.06.032OAI: oai:DiVA.org:liu-88525DiVA: diva2:604678