Total internal reflection ellipsometry
2000 (English)In: Eurosensors XIV: The 14th European Conference on Solid-State Transducers : Book of Abstracts / [ed] R. de Reus, S. Bouwstra, MIC , 2000, 239-242 p.Conference paper (Refereed)
A new measurement technique combining ellipsometry and total internal reflection is presented. This technique is called total internal reflection ellipsometry and opens new possibilities for measuring adsorption on metalsurfaces. Very promising results from protein adsorption on a gold surface are presented. Also a schematic design of the instrument used in total internal reflection ellipsometry is included. The main advantage compared to normal ellipsometry is that measurements can be done in opaque ambients because of total internal reflection.
Place, publisher, year, edition, pages
MIC , 2000. 239-242 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-89506ISBN: 87-899-3551-9OAI: oai:DiVA.org:liu-89506DiVA: diva2:608182
The 14th European Conference on Solid-State Transducers, 27-30 August 2000 Copenhagen, Denmark