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Reliability Challenges in Avionics due to Silicon Aging
Linköping University, Department of Electrical Engineering, Electronic Devices. Linköping University, The Institute of Technology.
Linköping University, Department of Electrical Engineering, Electronic Devices. Linköping University, The Institute of Technology.
Linköping University, Department of Electrical Engineering, Electronic Devices. Linköping University, The Institute of Technology.
2012 (English)In: 2012 IEEE 15TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS and SYSTEMS (DDECS), IEEE , 2012, 342-347 p.Conference paper, Published paper (Refereed)
Abstract [en]

Todays aviation systems are strongly dependent on electronics. Avionics (i.e., aviation electronics) should be highly reliable due to the nature of their applications. CMOS technology, which is widely used in the fabrication of integrated circuits, is continuously scaled to achieve higher performance and higher integration density (i.e., the well-known Moores law). This scaling property creates new challenges in reliability of avionics. As an example, the aging process is speeded up resulting in shorter time to wear-out. This paper investigates reliability challenges in design of avionics caused by silicon aging. It is shown that in the circuits and systems designed in modern CMOS technology, aging phenomenon have to be considered as a serious concern.

Place, publisher, year, edition, pages
IEEE , 2012. 342-347 p.
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-96555DOI: 10.1109/DDECS.2012.6219085ISI: 000312905700078ISBN: 978-1-4673-1188-5 (print)ISBN: 978-1-4673-1186-1 (print)ISBN: 978-1-4673-1187-8 (print)OAI: oai:DiVA.org:liu-96555DiVA: diva2:642253
Conference
IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Available from: 2013-08-21 Created: 2013-08-20 Last updated: 2014-11-13

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Mesgarzadeh, BehzadSöderquist, IngemarAlvandpour, Atila

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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  • Other style
More styles
Language
  • de-DE
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  • nn-NB
  • sv-SE
  • Other locale
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Output format
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