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Magnetic Scanning Probe Calibration Using Graphene Hall Sensor
National Phys Lab, England.
CSIC, Spain.
Chalmers, Sweden.
Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
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2013 (English)In: IEEE transactions on magnetics, ISSN 0018-9464, E-ISSN 1941-0069, Vol. 49, no 7, 3520-3523 p.Article in journal (Refereed) Published
Abstract [en]

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (Bprobe) for quantitative measurements. We present a straightforward calibration of Bprobe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined Bprobe ~ 70 mT and ~ 76 mT for probes with nominal magnetic moment ~ 1 × 10-13 and > 3 × 10-13 emu, respectively, at a probe-sample distance of 20 nm.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2013. Vol. 49, no 7, 3520-3523 p.
Keyword [en]
Epitaxial graphene, Hall sensor, Kelvin probe force microscopy (KPFM), magnetic probe calibration
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-97252DOI: 10.1109/TMAG.2013.2243127ISI: 000322483200114OAI: oai:DiVA.org:liu-97252DiVA: diva2:645765
Note

Funding Agencies|Concept Graphene project||IRD Graphene project||MetMags project|||CSD2010-00024|

Available from: 2013-09-05 Created: 2013-09-05 Last updated: 2017-12-06

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Yakimova, Rositsa

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