Focused Calibration for Advanced RF Test with Embedded RF Detectors
2013 (English)In: European Conference on Circuit Theory and Design (ECCTD), 2013, IEEE , 2013, 1-4 p.Conference paper (Refereed)
In this paper a technique suitable for on-chip IP3/IP2 RF test by embedded RF detectors is presented. A lack of spectral selectivity of the detectors and diverse nonlinearity of the circuit under test (CUT) impose stiff constraints on the respective test measurements for which focused calibration approach and a support by customized models of CUT is necessary. Also cancellation of second-order intermodulation effects produced by the detectors under the two-tone test is required. The test technique is introduced using a polynomial model of the CUT. Simulation example of a practical CMOS LNA under IP3/IP2 RF test with embedded RF detectors is presented showing a good measurement accuracy.
Place, publisher, year, edition, pages
IEEE , 2013. 1-4 p.
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:liu:diva-97268DOI: 10.1109/ECCTD.2013.6662259ISBN: 9783000437854 (print)ISBN: 9783000434303 (USB)OAI: oai:DiVA.org:liu-97268DiVA: diva2:645864
21st European Conference on Circuit Theory and Design (ECCTD), September 8-12, Dresden, Germany