Bandgap Engineering and Optical Constants of YxAl1-xN Alloys
2013 (English)In: Japanese Journal of Applied Physics, ISSN 0021-4922, E-ISSN 1347-4065, Vol. 52, no 8Article in journal (Refereed) Published
We study wurtzite Yx Al1-xN (0 andlt;= x andlt;= 0:22) films with (0001) orientation deposited by magnetron sputtering epitaxy on Si(100) substrates and we determine the alloys band gap energies and optical constants. Room temperature spectroscopic ellipsometry (SE) is employed in the energy range from 1 to 6.3 eV, and data modeling based on the standard dielectric function model is used. As a result of the SE data analysis the Yx Al1-xN refractive index and extinction coefficient are determined. The band gap of Yx Al1-xN is found to decrease linearly from 6.2 eV (x=0) down to 4.5 eV (x=0:22). We further observe an increase of the refractive index with increasing Y content; from 1.93 to 2.20 (at 2 eV) for x=0 and 0.22, respectively, reflecting the increase in material density.
Place, publisher, year, edition, pages
Japan Society of Applied Physics , 2013. Vol. 52, no 8
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-98153DOI: 10.7567/JJAP.52.08JM02ISI: 000323883100159OAI: oai:DiVA.org:liu-98153DiVA: diva2:652282
Funding Agencies|FCT|REF:SFRH/BPD/66818/2009|Swedish Research Council (VR)|2010-3848|Linko "ping Linnaeus Initiative on Nanoscale Functional Materials (LiLiNFM)||Swedish Governmental Agency for Innovation Systems (VINNOVA)|2011-03486|2013-09-302013-09-302016-08-31