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Standardization of surface potential measurements of graphene domains
National Phys Lab, England.
National Phys Lab, England.
Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
National Phys Lab, England.
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2013 (English)In: Scientific Reports, ISSN 2045-2322, Vol. 3Article in journal (Refereed) Published
Abstract [en]

We compare the three most commonly used scanning probe techniques to obtain a reliable value of the work function in graphene domains of different thickness. The surface potential (SP) of graphene is directly measured in Hall bar geometry via a combination of electrical functional microscopy and spectroscopy techniques, which enables calibrated work function measurements of graphene domains in ambient conditions with values Φ1LG ~4.55 ± 0.02 eV and Φ2LG ~ 4.44 ± 0.02 eV for single- and bi-layer, respectively. We demonstrate that frequency-modulated Kelvin probe force microscopy (FM-KPFM) provides more accurate measurement of the SP than amplitude-modulated (AM)-KPFM. The discrepancy between experimental results obtained by different techniques is discussed. In addition, we use FM-KPFM for contactless measurements of the specific components of the device resistance. We show a strong non-Ohmic behavior of the electrode-graphene contact resistance and extract the graphene channel resistivity.

Place, publisher, year, edition, pages
Nature Publishing Group: Open Access Journals - Option B / Nature Publishing Group , 2013. Vol. 3
National Category
Engineering and Technology
URN: urn:nbn:se:liu:diva-98143DOI: 10.1038/srep02597ISI: 000324016900001OAI: diva2:652295

Funding Agencies|NMS under the IRD Graphene Project (NPL)||EU FP7 Project ConceptGraphene||

Available from: 2013-09-30 Created: 2013-09-30 Last updated: 2013-10-08

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Yakimova, Rositsa
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