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Non-contact method for measurement of the microwave conductivity of graphene
National Phys Lab, England .
National Phys Lab, England .
National Phys Lab, England .
University of London Imperial Coll Science Technology and Med, England .
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2013 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 103, no 12Article in journal (Refereed) Published
Abstract [en]

We report a non-contact method for conductivity and sheet resistance measurements of monolayer and few layers graphene samples using a high Q microwave dielectric resonator perturbation technique, with the aim of fast and accurate measurement. The dynamic range of the microwave conductivity measurements makes this technique sensitive to a range of imperfections and impurities and can provide rapid non-contacting characterisation. As a demonstration of the power of the technique, we present results for graphene samples grown by three different methods with widely differing sheet resistance values.

Place, publisher, year, edition, pages
American Institute of Physics (AIP) , 2013. Vol. 103, no 12
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-100317DOI: 10.1063/1.4821268ISI: 000324826000055OAI: oai:DiVA.org:liu-100317DiVA: diva2:661478
Note

Funding Agencies|UK NMS Programme||EU EMRP Project MetNEMS|NEW-08|EU FP7 Project Concept Graphene||EMRP||EURAMET||European Union||

Available from: 2013-11-04 Created: 2013-11-04 Last updated: 2017-12-06

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Yakimova, Rositsa

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
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Output format
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