Structural study of nanostructured mixed phase vanadium oxide thin films
2013 (English)In: ICE, International Conference on Electroceramics, 2013, 2013Conference paper, Abstract (Other academic)
The studied vanadium oxide thin films were found to be composed of V2O5 phase and of V7O16 phase, shown by XRD and Raman spectroscopy studies. AFM, SEM and STEM studies confirmed the varying surface potential, roughness according to the phase structure and a clear porosity was found in the film with mixed phased structure. Also some pillar type nanostructures were observed in the films with V7O16 phase present.
Place, publisher, year, edition, pages
vanadium oxide, thin film, structure
IdentifiersURN: urn:nbn:se:liu:diva-102962OAI: oai:DiVA.org:liu-102962DiVA: diva2:685149
6th International Conference on Electroceramics (ICE 2013, 9-13 November 2013, Joao Pessoa, Brazil