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Structural study of nanostructured mixed phase vanadium oxide thin films
University of Oulu, Finland. (Microelectronics and Material Physics Laboratories)
University of Oulu, Finland. (Microelectronics and Material Physics Laboratories)
Linköping University, Department of Physics, Chemistry and Biology, Applied Sensor Science. Linköping University, The Institute of Technology.
University of Oulu. (Microelectronics and Material Physics Laboratories)
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2013 (English)In: ICE, International Conference on Electroceramics, 2013, 2013Conference paper, Abstract (Other academic)
Abstract [en]

The studied vanadium oxide thin films were found to be composed of V2O5 phase and of V7O16 phase, shown by XRD and Raman spectroscopy studies. AFM, SEM and STEM studies confirmed the varying surface potential, roughness according to the phase structure and a clear porosity was found in the film with mixed phased structure. Also some pillar type nanostructures were observed in the films with V7O16 phase present. 

Place, publisher, year, edition, pages
Keyword [en]
vanadium oxide, thin film, structure
National Category
Materials Engineering
URN: urn:nbn:se:liu:diva-102962OAI: diva2:685149
6th International Conference on Electroceramics (ICE 2013, 9-13 November 2013, Joao Pessoa, Brazil
Available from: 2014-01-08 Created: 2014-01-08 Last updated: 2014-01-27

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Eriksson, JensLloyd Spetz, Anita
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