Photoluminescence topography of fluorescent SiC and its corresponding source crystals
2013 (English)In: Silicon Carbide and Related Materials 2012 / [ed] Alexander A. Lebedev, Sergey Yu. Davydov, Pavel A. Ivanov and Mikhail E. Levinshtein, Trans Tech Publications Inc., 2013, Vol. 740-742, 421-424 p.Conference paper (Refereed)
The preparation and application of co-doped polycrystalline SiC as source in sublimation growth of fluorescent layers is a complex topic. Photoluminescence topographies of luminescent 6H-SiC layers and their corresponding source crystals have been studied in order to investigate the dependence of the epitaxial growth on the source material. It is shown that the homogeneity concerning the dopant incorporation and the layer luminescence intensity does not depend on the characteristics of the PVT grown source material. Therefore co-doped polycrystalline SiC is a promising source material in fast sublimation growth of luminescent 6H-SiC.
Place, publisher, year, edition, pages
Trans Tech Publications Inc., 2013. Vol. 740-742, 421-424 p.
, Materials Science Forum, ISSN 0255-5476 ; 740-742
luminescent SiC; 6H-SiC; epitaxy; photoluminescence topography
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-103067DOI: 10.4028/www.scientific.net/MSF.740-742.421OAI: oai:DiVA.org:liu-103067DiVA: diva2:686639
9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), St Petersburg, Russia, September 2-6, 2012