liu.seSearch for publications in DiVA
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
RF Calibration of On-Chip DfT Chain by DC Stimuli and Statistical Multivariate Regression Technique
United Arab Emirates University.
Linköping University, Department of Electrical Engineering, Communication Systems. Linköping University, The Institute of Technology.
2015 (English)In: Integration, ISSN 0167-9260, E-ISSN 1872-7522, Vol. 49, 14-21 p.Article in journal (Refereed) Published
Abstract [en]

The problem of parameter variability in RF and analog circuits is escalating with CMOS scaling. Consequently every RF chip produced in nano-meter CMOS technologies needs to be tested. On-chip Design for Testability (DfT) features, which are meant to reduce test time and cost also suffer from parameter variability. Therefore, RF calibration of all on-chip test structures is mandatory. In this paper, Artificial Neural Networks (ANN) are employed as a multivariate regression technique to architect a general RF calibration scheme using DC- instead of RF (GHz) stimuli. The use of DC stimuli relaxes the package design and on-chip routing that results in test cost reduction. A DfT circuit (RF detector, Test-ADC, Test-DAC and multiplexers) designed in 65nm CMOS is used to demonstrate the proposed calibration scheme. The simulation results show that the cumulative variation in a DfT circuit due to process and mismatch can be estimated and successfully calibrated, i.e. 25% error in DfT circuit response can be reduced to 2.5% for input stimuli in excess of 500mV. This reduction in error makes parametric tests feasible to classify the bad and good dies especially before expensive RF packaging.

Place, publisher, year, edition, pages
Elsevier, 2015. Vol. 49, 14-21 p.
Keyword [en]
DfT, On-chip RF detector, RF BIST, RF calibration, RF DfT, RF testing, ANN application
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-105514DOI: 10.1016/j.vlsi.2014.11.006ISI: 000351018200002OAI: oai:DiVA.org:liu-105514DiVA: diva2:707842
Available from: 2014-03-25 Created: 2014-03-25 Last updated: 2017-12-05

Open Access in DiVA

fulltext(8518 kB)73 downloads
File information
File name FULLTEXT01.pdfFile size 8518 kBChecksum SHA-512
1f2414fe62199e6b482c88d759bfd5216fce595d2273a7da41585bef449b51cf970f5f05fd8ffcb81fd5dc4ac2c0d358a9305edc2e8f1568071ebb63b1ebdf62
Type fulltextMimetype application/pdf

Other links

Publisher's full text

Authority records BETA

Dabrowski, Jerzy

Search in DiVA

By author/editor
Dabrowski, Jerzy
By organisation
Communication SystemsThe Institute of Technology
In the same journal
Integration
Engineering and Technology

Search outside of DiVA

GoogleGoogle Scholar
Total: 73 downloads
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 432 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf