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Characterisation of Nanoparticle Structure by High Resolution Electron Microscopy
Linköping University, Department of Physics, Chemistry and Biology, Plasma and Coating Physics. Linköping University, The Institute of Technology.ORCID iD: 0000-0002-6602-7981
Linköping University, Department of Physics, Chemistry and Biology, Plasma and Coating Physics. Linköping University, The Institute of Technology.
Linköping University, Department of Physics, Chemistry and Biology, Plasma and Coating Physics. Linköping University, The Institute of Technology.ORCID iD: 0000-0003-3767-225X
Linköping University, Department of Physics, Chemistry and Biology, Plasma and Coating Physics. Linköping University, The Institute of Technology.ORCID iD: 0000-0002-1744-7322
2014 (English)In: Electron Microscopy and Analysis Group Conference  (EMAG2013), Institute of Physics Publishing (IOPP), 2014, Vol. 522, no 012065, 012065- p.Conference paper, Published paper (Refereed)
Abstract [en]

Whilst the use of microscopic techniques to determine the size distributions of nanoparticle samples is now well established, their characterisation challenges extend well beyond this. Here it is shown how high resolution electron microscopy can help meet these challenges. One of the key parameters is the determination of particle shape and structure in three dimensions. Here two approaches to determining nanoparticle structure are described and demonstrated. In the first scanning transmission electron microscopy combined with high angle annular dark field imaging (HAADF-STEM) is used to image homogenous nanoparticles, where the contrast is directly related to the thickness of the material in the electron beam. It is shown that this can be related to the three dimensional shape of the nano-object. High resolution TEM imaging, combined with fast Fourier transform (FFT) analysis, can determine the crystalline structure and orientation of nanoparticles as well as the presence of any defects. This combined approach allows the physical structure of a significant number of nano-objects to be characterised, relatively quickly.

Place, publisher, year, edition, pages
Institute of Physics Publishing (IOPP), 2014. Vol. 522, no 012065, 012065- p.
Series
Journal of Physics Conference Series, ISSN 1742-6588 ; 522
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:liu:diva-110717DOI: 10.1088/1742-6596/522/1/012065ISI: 000340969200065OAI: oai:DiVA.org:liu-110717DiVA: diva2:748424
Conference
Conference of the Electron-Microscopy-and-Analysis-Group (EMAG)
Available from: 2014-09-19 Created: 2014-09-19 Last updated: 2014-11-05Bibliographically approved

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Boyd, RobertGunnarsson, RickardPilch, IrisHelmersson, Ulf

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