Optical properties of CuCdTeO thin films sputtered from CdTe-CuO composite targets
2014 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 571, 706-711 p.Article in journal (Refereed) Published
The effective complex dielectric function (ε) of Cu and O containing CdTe thin films is reported in the spectral range of 0.05 to 6 eV. The films were fabricated by rf sputtering from targets comprised by a mixture of CdTe and CuO powders with nominal Cu and O concentrations in the range of 2–10 at.%. Low concentration levels improved the crystalline quality of the films. Spectroscopic ellipsometry and transmittance measurements were used to determine ε. The critical point energies E1, E1+Δ1, and E2 of CdTe are red-shifted with the incorporation of Cu and O. Also, an absorption band is developed in the infrared range which is associated with a mixture of CdTe and low resistivity phases Cu2 − xTe according to an effective medium analysis. The elemental distribution of the films was mapped by energy dispersive X-ray spectroscopy using scanning transmission electron microscopy.
Place, publisher, year, edition, pages
Elsevier, 2014. Vol. 571, 706-711 p.
Condensed Matter Physics
IdentifiersURN: urn:nbn:se:liu:diva-112740DOI: 10.1016/j.tsf.2014.01.042ISI: 000346055200070OAI: oai:DiVA.org:liu-112740DiVA: diva2:770521
6th International Conference on Spectroscopic Ellipsometry (ICSE-VI), May 26–31, 2013, Kyoto, Japan