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Electrical and Piezoresistive Properties of Thick Film Resistors (Propiedades Eléctricas y Piezorresistivas de Resistores de Película Gruesa)
University of Buenos Aires, Argentina.
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology. University of Buenos Aires, Argentina.ORCID iD: 0000-0003-3277-1945
University of Buenos Aires, Argentina.
1997 (English)In: Anales AFA, ISSN 1850-1158, Vol. 8, no 1, 198-200 p.Article in journal (Refereed) Published
Abstract [en]

Thick film cermet resistors, adjusted by conventional trimming methods, undergo irreversible changes in successive deformation cycles. In this work the stability of resistors adjusted by laser irradiation is evaluated. Resistance, thermal coefficient of resistance, and strain gauge factor in resistors with and without surface treatment are studied. The irradiated surface was characterized by Auger spectroscopy.

Abstract [es]

Los resistores de película gruesa tipo cermet, ajustados por el método convencional de recorte, sufren cambios irreversibles en ciclos sucesivos de deformación. En este trabajo se evalúa la estabilidad de resistores ajustados por irradiación láser. Se estudian la resistencia, coeficiente térmico de resistencia y factor extensométrico de resistores con y sin tratamiento superficial. La superficie irradiada fue caracterizada por espectroscopía Auger.

Place, publisher, year, edition, pages
Buenos Aires, Argentina: AnalesAfa , 1997. Vol. 8, no 1, 198-200 p.
National Category
Physical Sciences
URN: urn:nbn:se:liu:diva-112933OAI: diva2:774492
Available from: 2014-12-23 Created: 2014-12-23 Last updated: 2016-09-01Bibliographically approved

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Broitman, Esteban
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Thin Film PhysicsThe Institute of Technology
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