Exploring optics of beetle cuticles with Mueller-matrix ellipsometry
2014 (English)In: Materials Today, ISSN 1369-7021, Vol. 1S, 155-160 p.Article in journal (Refereed) Published
Spectroscopic Mueller-matrix ellipsometry at variable angles of incidence is applied to beetle cuticles using a small (50 -100 μm) spot size. It is demonstrated how ellipticity and degree of polarization of the reflected light can be derived from a Mueller matrix providing a detailed insight into reflection properties. Results from Cetonia aurata, Chrysina argenteola and Cotinis mutabilis are presented. The use of Mueller matrices in regression analysis to extract structural and optical parameters of cuticles is briefly described and applied to cuticle data from Cetonia aurata whereby the pitch of the twisted layered structure in the cuticle is determined as well as the refractive indices of the epicuticle and the exocuticle.
Place, publisher, year, edition, pages
Elsevier, 2014. Vol. 1S, 155-160 p.
Beetle cuticles; Twisted layered structures; Mueller matrices; Ellipsometry; Electromagnetic modeling
IdentifiersURN: urn:nbn:se:liu:diva-112943DOI: 10.1016/j.matpr.2014.09.016OAI: oai:DiVA.org:liu-112943DiVA: diva2:774779
Living Light: Uniting biology and photonics – A memorial meeting in honour ofProf Jean-Pol Vigneron
FunderSwedish Research CouncilKnut and Alice Wallenberg FoundationCarl Tryggers foundation