Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope
2002 (English)In: Physica. E, Low-Dimensional systems and nanostructures, ISSN 1386-9477, E-ISSN 1873-1759, Vol. 13, no 2-4, 1247-1250 p.Article in journal (Refereed) Published
For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injection and bulk transport in detail. It is found that tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode.
Place, publisher, year, edition, pages
Elsevier , 2002. Vol. 13, no 2-4, 1247-1250 p.
scanning-tunneling microscopy; organic semiconductor; poly-phenylene-vinylene
IdentifiersURN: urn:nbn:se:liu:diva-118222DOI: 10.1016/S1386-9477(02)00346-6ISI: 000176869100269OAI: oai:DiVA.org:liu-118222DiVA: diva2:813324
10th International Conference on Modulated Semiconductor Structures