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Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope
Linköping University, Department of Physics, Chemistry and Biology, Chemical and Optical Sensor Systems. Linköping University, The Institute of Technology.ORCID iD: 0000-0002-7104-7127
Eindhoven University of Technology, Netherlands.
Eindhoven University of Technology, Netherlands.
Eindhoven University of Technology, Netherlands.
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2002 (English)In: Physica. E, Low-Dimensional systems and nanostructures, ISSN 1386-9477, E-ISSN 1873-1759, Vol. 13, no 2-4, 1247-1250 p.Article in journal (Refereed) Published
Abstract [en]

For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injection and bulk transport in detail. It is found that tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode.

Place, publisher, year, edition, pages
Elsevier , 2002. Vol. 13, no 2-4, 1247-1250 p.
Keyword [en]
scanning-tunneling microscopy; organic semiconductor; poly-phenylene-vinylene
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:liu:diva-118222DOI: 10.1016/S1386-9477(02)00346-6ISI: 000176869100269OAI: oai:DiVA.org:liu-118222DiVA: diva2:813324
Conference
10th International Conference on Modulated Semiconductor Structures
Available from: 2015-05-22 Created: 2015-05-22 Last updated: 2015-05-29

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Kemerink, Martijn
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Chemical and Optical Sensor SystemsThe Institute of Technology
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