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Local Charge Trapping in Conjugated Polymers Resolved by Scanning Kelvin Probe Microscopy
University of Cambridge, England.
University of Cambridge, England.
University of Cambridge, England.
University of Southampton, England.
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2009 (English)In: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 103, no 25, 256803Article in journal (Refereed) Published
Abstract [en]

The microstructure of conjugated polymers is heterogeneous on the length scale of individual polymer chains, but little is known about how this affects their electronic properties. Here we use scanning Kelvin probe microscopy with resolution-enhancing carbon nanotube tips to study charge transport on a 100 nm scale in a chain-extended, semicrystalline conjugated polymer. We show that the disordered grain boundaries between crystalline domains constitute preferential charge trapping sites and lead to variations on a 100 nm scale of the carrier concentration under accumulation conditions.

Place, publisher, year, edition, pages
American Physical Society , 2009. Vol. 103, no 25, 256803
National Category
Physical Sciences
URN: urn:nbn:se:liu:diva-118179DOI: 10.1103/PhysRevLett.103.256803ISI: 000272958300033OAI: diva2:813518

Funding Agencies|Engineering and Physical Sciences Research Council (EPSRC); Cambridge Integrated Knowledge Center (CIKC)

Available from: 2015-05-22 Created: 2015-05-22 Last updated: 2015-06-01

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Kemerink, Martijn
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Chemical and Optical Sensor SystemsThe Institute of Technology
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