Local Charge Trapping in Conjugated Polymers Resolved by Scanning Kelvin Probe Microscopy
2009 (English)In: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 103, no 25, 256803Article in journal (Refereed) Published
The microstructure of conjugated polymers is heterogeneous on the length scale of individual polymer chains, but little is known about how this affects their electronic properties. Here we use scanning Kelvin probe microscopy with resolution-enhancing carbon nanotube tips to study charge transport on a 100 nm scale in a chain-extended, semicrystalline conjugated polymer. We show that the disordered grain boundaries between crystalline domains constitute preferential charge trapping sites and lead to variations on a 100 nm scale of the carrier concentration under accumulation conditions.
Place, publisher, year, edition, pages
American Physical Society , 2009. Vol. 103, no 25, 256803
IdentifiersURN: urn:nbn:se:liu:diva-118179DOI: 10.1103/PhysRevLett.103.256803ISI: 000272958300033OAI: oai:DiVA.org:liu-118179DiVA: diva2:813518
Funding Agencies|Engineering and Physical Sciences Research Council (EPSRC); Cambridge Integrated Knowledge Center (CIKC)2015-05-222015-05-222015-06-01