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Quantitative atom column position analysis at the incommensurate interfaces of a (PbS)(1.14)NbS2 misfit layered compound with aberration-corrected HRTEM
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering.
University of Kiel, Germany.
Forschungszentrum Julich, Germany; Forschungszentrum Julich, Germany.
University of Kiel, Germany.
2011 (English)In: Ultramicroscopy, ISSN 0304-3991, E-ISSN 1879-2723, Vol. 111, no 3, 245-250 p.Article in journal (Refereed) Published
Abstract [en]

Aberration-corrected HRTEM is applied to explore the potential of NCSI contrast imaging to quantitatively analyse the complex atomic structure of misfit layered compounds and their incommensurate interfaces. Using the (PbS)(1.14)NbS2 misfit layered compound as a model system it is shown that atom column position analyses at the incommensurate interfaces can be performed with precisions reaching a statistical accuracy of +/- 6 pm. The procedure adopted for these studies compares experimental images taken from compound regions free of defects and interface modulations with a structure model derived from XRD experiments and with multi-slice image simulations for the corresponding NCSI contrast conditions used. The high precision achievable in such experiments is confirmed by a detailed quantitative analysis of the atom column positions at the incommensurate interfaces, proving a tetragonal distortion of the monochalcogenide sublattice. (C) 2010 Elsevier B.V. All rights reserved.

Place, publisher, year, edition, pages
Elsevier , 2011. Vol. 111, no 3, 245-250 p.
Keyword [en]
Quantitative aberration-corrected HRTEM; Misfit layered compound; Interfaces
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Identifiers
URN: urn:nbn:se:liu:diva-118560DOI: 10.1016/j.ultramic.2010.11.031ISI: 000288638200009PubMedID: 21333862OAI: oai:DiVA.org:liu-118560DiVA: diva2:815498
Note

Funding Agencies|German Research Foundation [DFG SP 648/2-1]

Available from: 2015-06-01 Created: 2015-06-01 Last updated: 2015-06-10

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Garbrecht, Magnus
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Thin Film PhysicsFaculty of Science & Engineering
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