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Advantages of aberration correction for HRTEM investigation of complex layer compounds
University of Kiel, Germany.
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering.
University of Kiel, Germany.
Forschungszentrum Julich, Germany; Forschungszentrum Julich, Germany.
2010 (English)In: Journal of Microscopy, ISSN 0022-2720, E-ISSN 1365-2818, Vol. 237, no 3, 341-346 p.Article in journal (Refereed) Published
Abstract [en]

Aberration-corrected high-resolution transmission electron microscopy (HRTEM) has been applied to resolve the atomic structure of a complex layered crystal, (PbS)(1.14)NbS(2), which comprises a high density of incommensurate interfaces. The strong suppression of image delocalization and the favourable contrast transfer under negative C(s) imaging (NCSI) conditions have been exploited for obtaining HRTEM images which directly reveal the projected crystal structure and allow to study lattice imperfections, like stacking disorder and layer undulations, with atomic scale resolution. The advantages of aberration-corrected HRTEM over conventional HRTEM are demonstrated by direct comparison of experimental images and computer simulations.

Place, publisher, year, edition, pages
Wiley: 12 months , 2010. Vol. 237, no 3, 341-346 p.
Keyword [en]
Aberrationcorrection; dichalcogenide; high-resolution transmission electron microscopy; layered material; misfit layer compound
National Category
Computer Vision and Robotics (Autonomous Systems)
Identifiers
URN: urn:nbn:se:liu:diva-118562DOI: 10.1111/j.1365-2818.2009.03257.xISI: 000274551700025PubMedID: 20500393OAI: oai:DiVA.org:liu-118562DiVA: diva2:815501
Conference
13th International Conference on Electron Microscopy
Available from: 2015-06-01 Created: 2015-06-01 Last updated: 2015-06-10

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Garbrecht, Magnus
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Thin Film PhysicsFaculty of Science & Engineering
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