Growth and oxidization stability of cubic Zr1-xGdxN solid solution thin films
2015 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 117, no 19, 195301- p.Article in journal (Refereed) Published
We report Zr1-xGdxN thin films deposited by magnetron sputter deposition. We show a solid solubility of the highly neutron absorbing GdN into ZrN along the whole compositional range, which is in excellent agreement with our recent predictions by first-principles calculations. An oxidization study in air shows that Zr1-xGdxN with x reaching from 1 to close to 0 fully oxidizes, but that the oxidization is slowed down by an increased amount of ZrN or stopped by applying a capping layer of ZrN. The crystalline quality of Zr0.5Gd0.5N films increases with substrate temperatures increasing from 100 degrees C to 900 degrees C.
Place, publisher, year, edition, pages
American Institute of Physics (AIP) , 2015. Vol. 117, no 19, 195301- p.
IdentifiersURN: urn:nbn:se:liu:diva-119249DOI: 10.1063/1.4921167ISI: 000355005600031OAI: oai:DiVA.org:liu-119249DiVA: diva2:820825
Funding Agencies|Swedish Research Council (VR) [621-2011-4417, 330-2014-6336]2015-06-122015-06-122016-08-31