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Wafer-scale epitaxial graphene on SiC for sensing applications
Department of Sensor System, Acreo Swedish ICT AB, Box 1070, SE-16440 Kista, Sweden; Department of Materials and Nano Physics, KTH-Royal Institute of Technology, Kista, Sweden .
Department of Sensor System, Acreo Swedish ICT AB, Box 1070, SE-16440 Kista, Sweden.
Department of Materials and Nano Physics, KTH-Royal Institute of Technology, Kista, Sweden.
Department of Sensor System, Acreo Swedish ICT AB, Box 1070, SE-16440 Kista, Sweden; Department of Materials and Nano Physics, KTH-Royal Institute of Technology, Kista, Sweden.
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2015 (English)In: Micro+Nano Materials, Devices, and Systems / [ed] Benjamin J. Eggleton, Stefano Palomba, SPIE - International Society for Optical Engineering, 2015, Vol. 9668, 96685T-1-96685T-7 p.Conference paper (Refereed)
Abstract [en]

The epitaxial graphene-on-silicon carbide (SiC-G) has advantages of high quality and large area coverage owing to a natural interface between graphene and SiC substrate with dimension up to 100 mm. It enables cost effective and reliable solutions for bridging the graphene-based sensors/devices from lab to industrial applications and commercialization. In this work, the structural, optical and electrical properties of wafer-scale graphene grown on 2’’ 4H semi-insulating (SI) SiC utilizing sublimation process were systemically investigated with focus on evaluation of the graphene’s uniformity across the wafer. As proof of concept, two types of glucose sensors based on SiC-G/Nafion/Glucose-oxidase (GOx) and SiC-G/Nafion/Chitosan/GOx were fabricated and their electrochemical properties were characterized by cyclic voltammetry (CV) measurements. In addition, a few similar glucose sensors based on graphene by chemical synthesis using modified Hummer’s method were also fabricated for comparison. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

Place, publisher, year, edition, pages
SPIE - International Society for Optical Engineering, 2015. Vol. 9668, 96685T-1-96685T-7 p.
Series
, SPIE - International Society for Optical Engineering. Proceedings, ISSN 0277-786X ; 9668
Keyword [en]
Graphene, SiC, wafer-scale, sensors
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:liu:diva-123956DOI: 10.1117/12.2202440ISI: 000370723500076ISBN: 9781628418903OAI: oai:DiVA.org:liu-123956DiVA: diva2:894488
Conference
Micro+Nano Materials, Devices, and Systems, Sydney, Australia, 6–9 December 2015
Available from: 2016-01-15 Created: 2016-01-15 Last updated: 2016-03-21Bibliographically approved

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Iakimov, TihomirYakimova, RositsaSyväjärvi, MikaelIvanov, Ivan G.
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