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Resonant inelastic soft X-ray scattering at the 4d edge of Ce-based heavy fermion materials
Uppsala University.
Uppsala University.ORCID iD: 0000-0002-0317-0190
Lawrence Berkeley National Laboratory, Berkeley, USA.
Lawrence Berkeley National Laboratory, Berkeley, USA.
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1999 (English)In: Journal of Electron Spectroscopy and Related Phenomena, ISSN 0368-2048, E-ISSN 1873-2526, Vol. 101-103, p. 783-786Article in journal (Refereed) Published
Abstract [en]

Resonant X-ray scattering measurements were performed on CeB6, CeAl, γ-Ce, and α-Ce at various incident-photon energies near the Ce 4d threshold. A pronounced inelastic scattering structure which has 4f character is observed at about 4 eV below the elastic peak. The structure shows a distinct resonant behavior as well as a dependence on the degree of 4f hybridization and can therefore be attributed to charge-transfer excitations to the 4f0 state. The intensity of the elastic peak increases when going from the systems with low Kondo temperature TK to those with high TK which is consistent with a Kondo scale behavior. By analyzing the scattering data, a controversial issue on the validity of a single-impurity Anderson model in heavy-fermion materials is addressed.

Place, publisher, year, edition, pages
1999. Vol. 101-103, p. 783-786
Keywords [en]
Resonant soft-X-ray scattering; Ce-based heavy-fermion systems; Charge-transfer excitations; X-ray absorption
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:liu:diva-54982DOI: 10.1016/S0368-2048(98)00369-7OAI: oai:DiVA.org:liu-54982DiVA, id: diva2:312902
Available from: 2010-04-26 Created: 2010-04-26 Last updated: 2018-06-04Bibliographically approved
In thesis
1. Electronic Structure Studies Using Resonant X-ray and Photemission Spectroscopy
Open this publication in new window or tab >>Electronic Structure Studies Using Resonant X-ray and Photemission Spectroscopy
1999 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

This thesis addresses the electronic structure of molecules and solids using resonant X-ray emission and photoemission spectroscopy. The use of monochromatic synchrotron radiation and the improved performance of the instrumentation have opened up the possibility of detailed analyses of the response of the electronic systems under interaction with X-rays. The experimental studies are accompanied by numerical ab initio calculations in the formalism of resonant inelastic scattering. The energy selectivity has made it possible for the first time to study how the chemical bonds in a molecule break up during resonant inelastic X-ray scattering. In the conjugated polymer systems, the element selectivity of the X-ray emission process made it possible to probe the different atomic elements separately. The X-ray emission technique proved to be useful for extracting isomeric information, and for measuring the change in the valence levels at different degrees of doping. In this thesis, spectral satellite features in transition metals were thoroughly investigated for various excitation energies around a core-level threshold. By measuring the relative spectral intensity of the satellites it was possible to extract information on the partial core-level widths. Using the nickel metal system as an example, it was shown that it is possible to probe the different core-excited states close toshake-up thresholds by measuring the relative spectral intensity variation of the Auger emission.Resonant photoemission measurements showed unambiguous evidence of interference effects. Theseeffects were also thoroughly probed using angle-dependent measurements. The combination of X-rayemission and absorption were useful for studying buried layers and interfaces due to the appreciable penetration depth of soft X-rays. X-ray scattering was further found to be useful for studying low-energy excited states of rare earth metallic compounds and transition metal oxides.

Place, publisher, year, edition, pages
Uppsala: Uppsala University, 1999
Series
Acta Universitatis Upsaliensis, ISSN 1104-232X ; 452
Keywords
Electronic structure, resonant x-ray emission, photoemission spectroscopy
National Category
Physical Sciences
Identifiers
urn:nbn:se:liu:diva-56480 (URN)91-554-4463-6 (ISBN)
Public defence
(English)
Opponent
Available from: 2010-05-19 Created: 2010-05-18 Last updated: 2018-06-04Bibliographically approved

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Magnuson, Martin

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