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  • 1.
    Aghaee Ghaleshahi, Nima
    et al.
    Linköpings universitet, Institutionen för datavetenskap, Programvara och system. Linköpings universitet, Tekniska högskolan.
    Peng, Zebo
    Linköpings universitet, Institutionen för datavetenskap, Programvara och system. Linköpings universitet, Tekniska högskolan.
    Eles, Petru
    Linköpings universitet, Institutionen för datavetenskap, Programvara och system. Linköpings universitet, Tekniska högskolan.
    Process-variation and Temperature Aware SoC Test Scheduling Technique2013Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 29, nr 4, s. 499-520Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    High temperature and process variation are undesirable phenomena affecting modern Systems-on-Chip (SoC). High temperature is a well-known issue, in particular during test, and should be taken care of in the test process. Modern SoCs are affected by large process variation and therefore experience large and time-variant temperature deviations. A traditional test schedule which ignores these deviations will be suboptimal in terms of speed or thermal-safety. This paper presents an adaptive test scheduling method which acts in response to the temperature deviations in order to improve the test speed and thermal safety. The method consists of an offline phase and an online phase. In the offline phase a schedule tree is constructed and in the online phase the appropriate path in the schedule tree is traversed based on temperature sensor readings. The proposed technique is designed to keep the online phase very simple by shifting the complexity into the offline phase. In order to efficiently produce high-quality schedules, an optimization heuristic which utilizes a dedicated thermal simulation is developed. Experiments are performed on a number of SoCs including the ITC'02 benchmarks and the experimental results demonstrate that the proposed technique significantly improves the cost of the test in comparison with the best existing test scheduling method.

  • 2.
    Aghaee, Nima
    et al.
    Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska fakulteten.
    Peng, Zebo
    Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska fakulteten.
    Eles, Petru
    Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska fakulteten.
    A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs2015Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, ISSN 0923-8174, Vol. 31, nr 5, s. 503-523Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    n a modern three-dimensional integrated circuit (3D IC), vertically stacked dies are interconnected using through silicon vias. 3D ICs are subject to undesirable temperature-cycling phenomena such as through silicon via protrusion as well as void formation and growth. These cycling effects that occur during early life result in opens, resistive opens, and stress induced carrier mobility reduction. Consequently these early-life failures lead to products that fail shortly after the start of their use. Artificially-accelerated temperature cycling, before the manufacturing test, helps to detect such early-life failures that are otherwise undetectable. A test-ordering based temperature-cycling acceleration technique is introduced in this paper that integrates a temperature-cycling acceleration procedure with pre-, mid-, and post-bond tests for 3D ICs. Moreover, it reduces the need for costly temperature chamber based temperature-cycling acceleration methods. All these result in a reduction in the overall test costs. The proposed method is a test-ordering and schedule based solution that enforces the required temperature cycling effect and simultaneously performs the tests whenever appropriate. Experimental results demonstrate the efficiency of the proposed technique.

  • 3.
    Ahmad, Shakeel
    et al.
    Linköpings universitet, Institutionen för systemteknik. Linköpings universitet, Tekniska fakulteten. Univ Management and Technol, Pakistan.
    Dabrowski, Jerzy
    Linköpings universitet, Institutionen för systemteknik, Kommunikationssystem. Linköpings universitet, Tekniska fakulteten.
    Design of Two-Tone RF Generator for On-Chip IP3/IP2 Test2019Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 35, nr 1, s. 77-85Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    In this paper a built-in-self-test (BiST) aimed at the third and second intercept point (IP3/IP2) characterization of RF receiver is discussed with a focus on a stimulus generator. The generator is designed based on a specialized phase-lock loop (PLL) architecture with two voltage controlled oscillators (VCOs) operating in GHz frequency range. The objective of PLL is to keep the VCOs frequency spacing under control. According to the test requirements the phase noise and nonlinear distortion of the two-tone generator are considered as a merit for the design of VCOs and analog adder. The PLL reference spurs, critical for the IP3 measurement, are avoided by means of a frequency doubling technique. The circuit is designed in 65nm CMOS. A highly linear analog adder with OIP3amp;gt;+15dBm and ring VCOs with phase noise amp;lt; -104 dBc/Hz at 1MHz offset are used to generate the RF stimulus of total power greater than -22dBm. In simulations a performance sufficient for IP3/IP2 test of a typical RF CMOS receiver is demonstrated.

  • 4.
    Ahmad, Shakeel
    et al.
    Linköpings universitet, Institutionen för systemteknik, Elektroniska komponenter. Linköpings universitet, Tekniska högskolan.
    Dabrowski, Jerzy
    Linköpings universitet, Institutionen för systemteknik, Elektroniska komponenter. Linköpings universitet, Tekniska högskolan.
    One-bit ΣΔ Encoded StimulusGeneration for on-Chip ADC Test2010Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727Artikkel i tidsskrift (Annet vitenskapelig)
  • 5.
    Izosimov, Viacheslav
    et al.
    Embedded Intelligent Solutions (EIS) by Semcon AB, Linköping, Sweden.
    Di Guglielmo, Giuseppe
    University of Verona, Italy.
    Lora, Michele
    University of Verona, Italy.
    Pravadelli, Graziano
    University of Verona, Italy.
    Fummi, Franco
    University of Verona, Italy.
    Peng, Zebo
    Linköpings universitet, Institutionen för datavetenskap, Programvara och system. Linköpings universitet, Tekniska högskolan.
    Fujita, Masahiro
    University of Tokyo, Japan; Japan Scence and Technology Agency, Japan.
    Time-Constraint-Aware Optimization of Assertions in Embedded Software2012Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 28, nr 4, s. 469-486Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    Technology shrinking and sensitization have led to more and more transient faults in embedded systems. Transient faults are intermittent and non-predictable faults caused by external events, such as energetic particles striking the circuits. These faults do not cause permanent damages, but may affect the running applications. One way to ensure the correct execution of these embedded applications is to keep debugging and testing even after shipping of the systems, complemented with recovery/restart options. In this context, the executable assertions that have been widely used in the development process for design validation can be deployed again in the final product. In this way, the application will use the assertion to monitor itself under the actual execution and will not allow erroneous out-of-the-specification behavior to manifest themselves. This kind of software-level fault tolerance may represent a viable solution to the problem of developing commercial off-the-shelf embedded systems with dependability requirements. But software-level fault tolerance comes at a computational cost, which may affect time-constrained applications. Thus, the executable assertions shall be introduced at the best possible points in the application code, in order to satisfy timing constraints, and to maximize the error detection efficiency. We present an approach for optimization of executable assertion placement in time-constrained embedded applications for the detection of transient faults. In this work, assertions have different characteristics such as tightness, i.e., error coverage, and performance degradation. Taking into account these properties, we have developed an optimization methodology, which identifies candidate locations for assertions and selects a set of optimal assertions with the highest tightness at the lowest performance degradation. The set of selected assertions is guaranteed to respect the real-time deadlines of the embedded application. Experimental results have shown the effectiveness of the proposed approach, which provides the designer with a flexible infrastructure for the analysis of time-constrained embedded applications and transient-fault-oriented executable assertions.

  • 6.
    Larsson, Erik
    et al.
    Linköpings universitet, Tekniska högskolan. Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
    Peng, Zebo
    Linköpings universitet, Tekniska högskolan. Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
    A reconfigurable power conscious core wrapper and its application to system-on-chip test scheduling2008Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 24, nr 5, s. 497-504Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    The increasing test application times required for testing system-on-chips (SOCs) is a problem that leads to higher costs. For modular core based SOCs it is possibly to employ a concurrent test scheme in order to lower the test application times. To allow each core to be tested as a separate unit, a wrapper is inserted for each core, the scan chains at each core are configured into a fixed number of wrapper chains, and the wrapper chains are connected to the test access mechanism. A problem with concurrent testing is that it leads to higher power consumption as several cores are active at a time. Power consumption above the specified limit of a core or above the limit of the system will cause damage and must be avoided. The power consumption must be controlled both at core level as well as on system level. In this paper, we propose a reconfigurable power conscious core wrapper that we include in a preemptive power constrained test scheduling algorithm. The advantages with the wrapper are that the number of wrapper chains at each core can dynamically be changed during test application and the possibility, through clock gating, to select the appropriate test power consumption for each core. The scheduling technique produces optimal solutions in respect to test time and selects wrapper configurations in a systematic manner while ensuring the power limits at core level and system level are not violated. The wrapper configurations are selected such that the number of wrapper configurations as well as the number of wrapper chains at each wrapper are minimized, which minimizes the wrapper logic as well as the total TAM routing. We have implemented the technique and the experimental results show the efficiency of our approach. © 2008 Springer Science+Business Media, LLC.

  • 7.
    Larsson, Erik
    et al.
    Linköpings universitet, Tekniska högskolan. Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
    Peng, Zebo
    Linköpings universitet, Tekniska högskolan. Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
    An Integrated Framework for the Design and Optimization of SOC Test Solutions2002Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 18, nr 4-5, s. 385-400Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    We propose an integrated framework for the design of SOC test solutions, which includes a set of algorithms for early design space exploration as well as extensive optimization for the final solution. The framework deals with test scheduling, test access mechanism design, test sets selection, and test resource placement. Our approach minimizes the test application time and the cost of the test access mechanism while considering constraints on tests and power consumption. The main feature of our approach is that it provides an integrated design environment to treat several different tasks at the same time, which were traditionally dealt with as separate problems. We have made an implementation of the proposed heuristic used for the early design space exploration and an implementation based on Simulated Annealing for the extensive optimization. Experiments on several benchmarks and industrial designs show the usefulness and efficiency of our approach.

  • 8.
    Larsson, Erik
    et al.
    Linköpings universitet, Tekniska högskolan. Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
    Pouget, Julien
    LIRMM Montpellier 2 University, CNRS.
    Peng, Zebo
    Linköpings universitet, Tekniska högskolan. Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
    Abort-on-Fail Based Test Scheduling2005Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 21, nr 6, s. 651-658Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    The long and increasing test application time for modular core-based system-on-chips is a major problem, and many approaches have been developed to deal with the problem. Different from previous approaches, where it is assumed that all tests will be performed until completion, we consider the cases where the test process is terminated as soon as a defect is detected. Such abort-on-fail testing is common practice in production test of chips. We define a model to compute the expected test time for a given test schedule in an abort-on-fail environment. We have implemented three scheduling techniques and the experimental results show a significant test time reduction (up to 90%) when making use of an efficient test scheduling technique that takes defect probabilities into account.

  • 9.
    Larsson, Erik
    et al.
    Linköpings universitet, Tekniska högskolan. Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
    Pouget, Julien
    LIRMM Montpellier 2 University, CNRS.
    Peng, Zebo
    Linköpings universitet, Tekniska högskolan. Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
    Multiple Constraints Driven System-on-Chip Test Time Optimization2005Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 21, nr 6, s. 599-611Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    The cost of testing SOCs (systems-on-chip) is highly related to the test application time. The problem is that the test application time increases as the technology makes it possible to design highly complex chips. These complex chips include a high number of fault sites, which need a high test data volume for testing, and the high test data volume leads to long test application times. For modular core-based SOCs where each module has its distinct tests, concurrent application of the tests can reduce the test application time dramatically, as compared to sequential application. However, when concurrent testing is used, resource conflicts and constraints must be considered. In this paper, we propose a test scheduling technique with the objective to minimize the test application time while considering multiple conflicts. The conflicts we are considering are due to cross-core testing (testing of interconnections between cores), module testing with multiple test sets, hierarchical conflicts in SOCs where cores are embedded in cores, the sharing of the TAM (test access mechanism), test power limitations, and precedence conflicts where the order in which tests are applied is important. These conflicts must be considered in order to design a test schedule that can be used in practice. In particular, the limitation on the test power consumption is important to consider since exceeding the system's power limit might damage the system. We have implemented a technique to integrate the wrapper design algorithm with the test scheduling algorithm, while taking into account all the above constraints. Extensive experiments on the ITC'02 benchmarks show that even though we consider a high number of constraints, our technique produces results that are in the range of results produced be techniques where the constraints are not taken into account.

  • 10.
    Sengupta, Breeta
    et al.
    Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
    Ingelsson, Urban
    Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
    Larsson, Erik
    Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
    Scheduling Tests for 3D Stacked Chips under Power Constraints2012Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 28, nr 1, s. 121-135Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    This paper addresses Test Application Time (TAT) reduction under power constraints for core-based 3D Stacked ICs (SICs) connected by Through Silicon Vias (TSVs). Unlike non-stacked chips, where the test flow is well defined by applying the same test schedule both at wafer sort and at package test, the test flow for 3D TSV-SICs is yet undefined. In this paper we present a cost model to find the optimal test flow. For the optimal test flow, we propose test scheduling algorithms that take the particulars of 3D TSV-SICs into account. A key challenge in testing 3D TSV-SICs is to reduce the TAT by co-optimizing the wafer sort and the package test while meeting power constraints. We consider a system of chips with cores that are accessed through an on-chip JTAG infrastructure and propose a test scheduling approach to reduce TAT while considering resource conflicts and meeting the power constraints. Depending on the test schedule, the JTAG interconnect lines that are required can be shared to test several cores. This is taken into account in experiments with an implementation of the proposed scheduling approach. The results show significant savings in TAT.

  • 11.
    SenGupta, Breeta
    et al.
    Lund Univ, Sweden.
    Nikolov, Dimitar
    Lund Univ, Sweden.
    Dash, Assmitra
    Linköpings universitet.
    Larsson, Erik
    Lund Univ, Sweden.
    Test Flow Selection for Stacked Integrated Circuits2019Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 35, nr 4, s. 425-440Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    Integrated circuits (ICs) with a single chip (die) are typically tested with a test flow consisting of two test instances: (1) wafer sort for the bare chip and (2) package test for the packaged IC. For ICs with stacked chips - 3D Stacked ICs - there are many possible test instances, even more test flows, and no commonly used test flow. In this paper, we propose a test flow selection algorithm (TFSA) to obtain a test flow for a given 3D Stacked IC. The TFSA results in a test flow for a given 3D Stacked IC, such that the expected total test time to produce each good package is minimized. We implemented the TFSA, three straightforward test flow schemes and an exhaustive search, and experimentally compared the test flow schemes on three different test architecture design approaches. The results demonstrate the importance to have methods both to select the test flow and design the test architecture.

  • 12.
    Zhiyuan, He
    et al.
    Linköpings universitet, Institutionen för datavetenskap. Linköpings universitet, Tekniska högskolan.
    Peng, Zebo
    Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
    Eles, Petru
    Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
    Rosinger, Paul
    University of Southampton.
    Al-Hashimi, Bashir
    University of Southampton.
    Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving2008Inngår i: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 24, nr 1-3, s. 247-257Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    High temperature has become a major problem for system-on-chip testing. In order to reduce the test application time while keeping the temperatures of the cores under test within safe ranges, a thermal-aware test scheduling technique is required. This paper presents an approach to minimize the test application time and, at the same time, prevent the temperatures of cores under test going beyond given limits. We employ test set partitioning to divide test sets into shorter test sequences, and add cooling periods between test sequences so that overheating can be avoided. Moreover, test sequences from different test sets are interleaved, such that the cooling periods and the bandwidth of the test bus can be utilized for test data transportation, and hence the test application time can be reduced. The test scheduling problem is formulated as a combinatorial optimization problem, and we use the constraint logic programming (CLP) to build the optimization model and find the optimal solution. As the optimization time of the CLP-based approach increases exponentially with the problem size, we also propose a heuristic which generates longer test schedules but requires substantially shorter optimization time. Experimental results have shown the efficiency of the proposed approach.

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