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  • 1.
    Larsson, Erik
    Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
    Conference Reports - RASDAT 2011: Workshop on Reliability Aware System Design and Test2011In: IEEE Design & Test of Computers, ISSN 0740-7475, E-ISSN 1558-1918, Vol. 28, no 3, p. S. 82-83p. 82-83Article in journal (Other academic)
    Abstract [en]

    Conference Reports features the second IEEE International Workshop on Reliability Aware System Design and Test (RASDAT),which was held in conjunction with the 24th International Conference on VLSI Design.

  • 2.
    Larsson, Erik
    Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
    Conference Reports: ETS 2011: European Test Symposium2011In: IEEE Design & Test of Computers, ISSN 0740-7475, E-ISSN 1558-1918, Vol. 28, no 5, p. 95-95Article in journal (Other (popular science, discussion, etc.))
  • 3.
    Marculescu, R.
    et al.
    Dept. of Elec./Computer Eng., Carnegie Mellon Univ., 5000 Forbes Ave., Pittburgh, PA 15213-3890, United States.
    Eles, Petru Ion
    Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
    Designing real-time embedded multimedia systems2004In: IEEE Design & Test of Computers, ISSN 0740-7475, E-ISSN 1558-1918, Vol. 21, no 5, p. 354-356Other (Other academic)
    Abstract [en]

    [No abstract available]

  • 4. Marculescu, R
    et al.
    Eles, Petru Ion
    Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
    Guest editors' introduction: Designing real-time embedded multimedia systems2004In: IEEE Design & Test of Computers, ISSN 0740-7475, E-ISSN 1558-1918, Vol. 21, no 5, p. 354-356Other (Other academic)
  • 5.
    Ning, T
    et al.
    Bell Labs, Murray Hill, NJ 07974 USA Intel Corp, Microprocessor Res Labs, Hillsboro, OR 97124 USA Lucent Technol, Murray Hill, NJ USA Compaq Comp Corp, Alpha Dev Grp, Houston, TX 77269 USA Univ Illinois, Urbana, IL 61801 USA Linkoping Univ, S-58183 Linkoping, Sweden.
    Svensson, C
    Shanbhag, N
    Bell Labs, Murray Hill, NJ 07974 USA Intel Corp, Microprocessor Res Labs, Hillsboro, OR 97124 USA Lucent Technol, Murray Hill, NJ USA Compaq Comp Corp, Alpha Dev Grp, Houston, TX 77269 USA Univ Illinois, Urbana, IL 61801 USA Linkoping Univ, S-58183 Linkoping, Sweden.
    Nicol, C
    Bell Labs, Murray Hill, NJ 07974 USA Intel Corp, Microprocessor Res Labs, Hillsboro, OR 97124 USA Lucent Technol, Murray Hill, NJ USA Compaq Comp Corp, Alpha Dev Grp, Houston, TX 77269 USA Univ Illinois, Urbana, IL 61801 USA Linkoping Univ, S-58183 Linkoping, Sweden.
    Preston, R
    Bell Labs, Murray Hill, NJ 07974 USA Intel Corp, Microprocessor Res Labs, Hillsboro, OR 97124 USA Lucent Technol, Murray Hill, NJ USA Compaq Comp Corp, Alpha Dev Grp, Houston, TX 77269 USA Univ Illinois, Urbana, IL 61801 USA Linkoping Univ, S-58183 Linkoping, Sweden.
    Gabara, T
    Bell Labs, Murray Hill, NJ 07974 USA Intel Corp, Microprocessor Res Labs, Hillsboro, OR 97124 USA Lucent Technol, Murray Hill, NJ USA Compaq Comp Corp, Alpha Dev Grp, Houston, TX 77269 USA Univ Illinois, Urbana, IL 61801 USA Linkoping Univ, S-58183 Linkoping, Sweden.
    D&T roundtable: Power delivery and distribution2000In: IEEE Design & Test of Computers, ISSN 0740-7475, E-ISSN 1558-1918, Vol. 17, no 4, p. 98-102Other (Other academic)
  • 6.
    Zadegan, Farrokh Ghani
    et al.
    Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
    Ingelsson, Urban
    Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
    Carlsson, Gunnar
    Ericsson, Linköping, Sweden.
    Larsson, Erik
    Lund University, Sweden.
    Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P16872012In: IEEE Design & Test of Computers, ISSN 0740-7475, E-ISSN 1558-1918, Vol. 29, no 2, p. 79-88Article in journal (Refereed)
    Abstract [en]

    This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE P1687 standard in an era where reuse of existing functional elements and integration of IP blocks is accelerating rapidly. It briefly discusses the deficiencies of existing 1149.1 (JTAG) and 1500 standards and demonstrates how the new standard, P1687, plugs these exposures by specifying JTAG as an off-chip to on-chip interface to the instrument access infrastructure. It provides a simple example to underscore the need for the standard and then builds on this example to show how the standard can be used for more complex situations.

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