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  • 1.
    A Atlasov, Kirill
    et al.
    Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland .
    Felici, Marco
    Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland .
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Gallo, Pascal
    Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland .
    Rudra, Alok
    Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland .
    Dwir, Benjamin
    Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland .
    Kapon, Eli
    Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland .
    1D photonic band formation and photon localization in finite-size photonic-crystal waveguides2010In: OPTICS EXPRESS, ISSN 1094-4087, Vol. 18, no 1, 117-122 p.Article in journal (Refereed)
    Abstract [en]

    A transition from discrete optical modes to 1D photonic bands is experimentally observed and numerically studied in planar photonic-crystal (PhC) L-N microcavities of length N. For increasing N the confined modes progressively acquire a well-defined momentum, eventually reconstructing the band dispersion of the corresponding waveguide. Furthermore, photon localization due to disorder is observed experimentally in the membrane PhCs using spatially resolved photoluminescence spectroscopy. Implications on single-photon sources and transfer lines based on quasi-1D PhC structures are discussed.

  • 2. Aavikko, R.
    et al.
    Saarinen, K.
    Magnusson, Björn
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Janzén, Erik
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Clustering of Vacancies in Semi-Insulating SiC Observed with Positron Spectroscopy2006In: Materials Science Forum, Vols. 527-529, 2006, Vol. 527-529, 575-578 p.Conference paper (Refereed)
  • 3. Aavikko, R
    et al.
    Saarinen, K
    Magnusson, Björn
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Janzén, Erik
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Observation of vacancy clusters in HTCVD grown SiC2005In: Materials Science Forum, Vols. 483-485, 2005, Vol. 483, 469-472 p.Conference paper (Refereed)
    Abstract [en]

    Positron lifetime spectroscopy was used to study defects in semi-insulating (SI) silicon carbide (SiC) substrates grown by high-temperature chemical vapor deposition (HTCVD). The measured positron lifetime spectra can be decomposed into two components, of which the longer corresponds to vacancy clusters. We have carried out atomic superposition calculations to estimate the size of these clusters.

  • 4. Aavikko, R.
    et al.
    Saarinen, K.
    Tuomisto, F.
    Magnusson, Björn
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Nguyen, Son Tien
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Janzén, Erik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Clustering of vacancy defects in high-purity semi-insulating SiC2007In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 75, no 8, 085208- p.Article in journal (Refereed)
    Abstract [en]

    Positron lifetime spectroscopy was used to study native vacancy defects in semi-insulating silicon carbide. The material is shown to contain (i) vacancy clusters consisting of four to five missing atoms and (ii) Si-vacancy-related negatively charged defects. The total open volume bound to the clusters anticorrelates with the electrical resistivity in both as-grown and annealed materials. Our results suggest that Si-vacancy-related complexes electrically compensate the as-grown material, but migrate to increase the size of the clusters during annealing, leading to loss of resistivity. © 2007 The American Physical Society.

  • 5.
    Aberg, D
    et al.
    Royal Inst Technol, SE-16440 Kista, Sweden Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden.
    Storasta, Liutauras
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Hallen, A
    Royal Inst Technol, SE-16440 Kista, Sweden Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden.
    Svensson, BG
    Implantation temperature dependent deep level defects in 4H-SiC2001In: Materials Science Forum, Vols. 353-356, 2001, Vol. 353-3, 443-446 p.Conference paper (Refereed)
    Abstract [en]

    Deep level transient spectroscopy spectra of the near Z-defect region (150-350K) were investigated for B implanted samples of low doses (10(8)-10(9) cm(-2)). For 300 degreesC implantation, a level at an energy of 0.41 eV below the conduction hand edge was found, referred to as the S-level. The S-center was shown to form in both implanted and electron irradiated 4H-SiC, either after room temperature (R.T.) implantation followed by mild heat treatments or lung R.T. storage (several months) or after 200-300 degreesC implantations/irradiations. The S-center was found to anneal out at temperatures above 250 degreesC.

  • 6.
    Adam, Stefan
    et al.
    Leibniz Institute Polymerforsch eV, Germany; Technical University of Dresden, Germany.
    Koenig, Meike
    Leibniz Institute Polymerforsch eV, Germany; Technical University of Dresden, Germany; Karlsruhe Institute Technology, Germany.
    Rodenhausen, Keith Brian
    University of Nebraska, NE 68588 USA; Biolin Science Inc, NJ 07652 USA.
    Eichhorn, Klaus-Jochen
    Leibniz Institute Polymerforsch eV, Germany.
    Oertel, Ulrich
    Leibniz Institute Polymerforsch eV, Germany.
    Schubert, Mathias
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering. Leibniz Institute Polymerforsch eV, Germany; University of Nebraska, NE 68588 USA; University of Nebraska, NE 68588 USA.
    Stamm, Manfred
    Leibniz Institute Polymerforsch eV, Germany; Technical University of Dresden, Germany.
    Uhlmann, Petra
    Leibniz Institute Polymerforsch eV, Germany; University of Nebraska, NE 68588 USA.
    Quartz crystal microbalance with coupled Spectroscopic Ellipsometry-study of temperature-responsive polymer brush systems2017In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 421, 843-851 p.Article in journal (Refereed)
    Abstract [en]

    Using a combined setup of quartz crystal microbalance with dissipation monitoring together with spectroscopic ellipsometry, the thermo-responsive behavior of two different brush systems (poly(N-isopropyl acrylamide) and poly(2-oxazoline)s) was investigated and compared to the behavior of the free polymer in solution. Poly(2-oxazoline)s with three different hydrophilicities were prepared by changing the content of a hydrophilic comonomer. While both polymer types exhibit a sharp, discontinuous thermal transition in solution, in the brush state the transition gets broader in the case of poly(N-isopropyl acrylamide) and is transformed into a continuous transition for poly(2-oxazoline)s. The position of the transition in solution is influenced by the degree of hydrophilicity of the poly(2-oxazoline). The difference in areal mass detected by quartz crystal microbalance and by spectroscopic ellipsometry, has been attributed to the chain segment density profile of the polymer brushes. Applying this density profile information, for poly(N-isopropyl acrylamide) two different swelling stages could be identified, while for poly(2-oxazoline) the transition between a parabolic and more step-wise profile is found continuous. The different swelling characteristics were attributed to the different miscibility behavior types, with the brush state acting similar to a crosslinked system. (C) 2017 Elsevier B.V. All rights reserved.

  • 7.
    Adnane, Bouchaib
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Hansson, Göran
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Ni, Wei-Xin
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Photoluminescence excitation spectroscopy of self-assembled SiGe/Si quantum dots2009Manuscript (preprint) (Other academic)
    Abstract [en]

    Photoluminescence excitation (PLE) experiments are reported for various self-assembled SiGe/Si dot samples grown on Si(001) by molecular beam epitaxy at substrate temperatures ranging from 430 to 580 C. Two excitation peaks were observed, and the characteristics of the involved optical transitions were studied in detail by PLE (in one case implemented together with selective photoluminescence, SPL) on different samples containing either only one SiGe dot layer or multiple SiGe-dot/Si stacks. The temperature- and power-dependence of the excitation properties together with the results of six-band k.p calculations support the assignment of the observed PLE peaks to spatially direct and indirect transitions collected from two different SiGe dot populations.

  • 8.
    Adnane, Bouchaib
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Hansson, Göran
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Holtz, Per-Olof
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Ni, Wei-Xin
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Spatially direct and indirect transitions of self-assembled SiGe/Si quantum dots studied by photoluminescence excitation spectroscopy2010In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 96, no 18, 181107- p.Article in journal (Refereed)
    Abstract [en]

    Well-resolved photoluminescence excitation (PLE) spectra are reported for selfassembled SiGe dots grown on Si(100) by molecular beam epitaxy. The observation of two excitation resonance peaks is attributed to two different excitation/de-excitation routes of interband optical transitions connected to the spatially direct and indirect recombination processes. It is concluded that two dot populations are addressed by each monitored luminescence energy for the PLE acquisition.

  • 9.
    Adnane, Bouchaib
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Zhao, Ming
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Hansson, Göran
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Ni, Wei-Xin
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Origin of photoresponse at 8-14 μm in stacks of self-assembled SiGe/Si quantum dots2009In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235XArticle in journal (Other academic)
    Abstract [en]

    A normal incidence photodetector operating at 8-14 μm is demonstrated using p-type δ-doped SiGe dot multilayer structures grown by molecular beam epitaxy on Si(001) substrates. Based on the experimental results of photoluminescence and photoluminescence excitation spectroscopies together with numerical analysis, the origin of the measured photocurrent was attributed to intersubband optical transitions between the heavy hole and light hole states of the valence band of the self-assembled SiGe dots and subsequent lateral transport of photo-excited carriers in the conduction channels formed by Ge wetting layers.

  • 10.
    Adnane, Bouchaib
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Lai, Yi-Fan
    National Nano Device Labs, Taiwan.
    Shieh, Jia-Min
    National Nano Device Labs, Taiwan.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Ni, Wei-Xin
    Linköping University, Department of Physics, Chemistry and Biology, Surface and Semiconductor Physics . Linköping University, The Institute of Technology.
    Photoluminescence study of nanocrystalline-Si(Ge) embedded in mesoporous silica2009In: Solid-State Electronics, ISSN 0038-1101, E-ISSN 1879-2405, Vol. 53, no 8, 862-864 p.Article in journal (Refereed)
    Abstract [en]

    Photoluminescence (PL) properties of mesoporous silica (MS) samples incorporated with Si or Ge nanocrystals (nc) have been investigated with various excitation powers and post-RTA processes. The analysis of experimental results revealed a superlinear intensity dependence (m = 1.7) in the MS reference sample without nanocrystals, while a sublinear behavior (m = 0.8) is observed for the nc-Si in MS. It thus suggests the same recombination responsible for the luminescence at similar to 2.75 eV for both samples, but different kinetic limitations for the carrier transfer processes. Si nanocrystals play in this case an important role in generating more photo-excited carriers, enhancing the PL intensity.

  • 11.
    Agekyan, V F
    et al.
    n/a.
    Holtz, P O
    Linköping University, Department of Physics, Chemistry and Biology, Materials Science . Linköping University, The Institute of Technology.
    Karczewski, G
    n/a.
    Moskalenko, E S
    n/a.
    Yu, A
    n/a.
    Serov, x
    n/a.
    Filosofov, N G
    n/a.
    Exciton localization and sp-d energy transfer in CdMnTe/CdMgTe nanostructures with ultrathin narrow-gap magnetic layers2009In: 17th Int. Symp. “Nanostructures: Physics and Technology”, 2009Conference paper (Refereed)
  • 12.
    Agekyan, V F
    et al.
    St Petersburg State University.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Karczewski, G
    Polish Acadamy of Science.
    Moskalenko, E S
    Russian Acadamy of Science.
    Yu Serov, A
    St Petersburg State University.
    Filosofov, N G
    St Petersburg State University.
    Effect of a magnetic field on energy transfer of band states to the Mn2+ 3d shell in the CdMgTe matrix with ultrathin CdMnTe layers2010In: PHYSICS OF THE SOLID STATE, ISSN 1063-7834, Vol. 52, no 1, 27-31 p.Article in journal (Refereed)
    Abstract [en]

    The effect of external magnetic fields on two radiative (band-to-band and on-site) recombination channels in II-VI dilute magnetic semiconductors and related nanostructures has been considered. The 3d on-site emission of manganese ions in CdMgTe matrices containing periodic inclusions of CdMnTe narrow-band-gap layers with thicknesses of 0.5, 1.5, and 3.0 monolayers has been investigated in magnetic fields of up to 6 T. It has been shown that, in a magnetic field, luminescence of manganese ions weakens because of the decrease in the rate of spin-dependent excitation transfer from band states to the Mn2+ 3d shell. The maximum suppression of 3d luminescence has been observed in the matrix with a CdMnTe layer 3.0 monolayers thick. This indicates that the main factor responsible for the energy transfer is the internal field near the CdMnTe layers, which determines the magnetic splitting and spin polarization of band states.

  • 13.
    Agekyan, V F
    et al.
    St Petersburg State University.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Karczewski, G
    Polish Academy of Science.
    N Katz, V
    St Petersburg State University.
    Moskalenko, E S
    Russian Academy of Science.
    Yu Serov, A
    St Petersburg State University.
    Filosofov, N G
    St Petersburg State University.
    Magnetoluminescence of CdTe/MnTe/CdMgTe heterostructures with ultrathin MnTe layers2011In: Semiconductors (Woodbury, N.Y.), ISSN 1063-7826, E-ISSN 1090-6479, Vol. 45, no 10, 1301-1305 p.Article in journal (Refereed)
    Abstract [en]

    CdTe/MnTe/CdMgTe quantum-well structures with one or two monolayers of MnTe inserted at CdTe/CdMgTe interfaces were fabricated. The spectra of the excitonic luminescence from CdTe quantum wells and their variation with temperature indicate that introduction of ultrathin MnTe layers improves the interface quality. The effect of a magnetic field in the Faraday configuration on the spectral position of the exciton-emission peaks indicates that frustration of magnetic moments in one-monolayer MnTe insertions is weaker than in two-monolayer insertions. The effect of a magnetic field on the exciton localization can be explained in terms of the exciton wave-function shrinkage and obstruction of the photoexcited charge-carrier motion in the quantum well.

  • 14.
    Ahmad, Mohammed Metwally Gomaa
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering. National Research Centre, Egypt.
    Yazdi, Gholamreza
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Schmidt, Susann
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering.
    Boshta, M.
    National Research Centre, Egypt.
    Khranovskyy, Volodymyr
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Eriksson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering.
    Farag, B. S.
    National Research Centre, Egypt.
    Osman, M. B. S.
    Ain Shams University, Egypt.
    Yakimova, Rositsa
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Effect of precursor solutions on the structural and optical properties of sprayed NiO thin films2017In: Materials Science in Semiconductor Processing, ISSN 1369-8001, E-ISSN 1873-4081, Vol. 64, 32-38 p.Article in journal (Refereed)
    Abstract [en]

    Nickel oxide thin films were deposited by a simple and low-cost spray pyrolysis technique using three different precursors: nickel nitrate, nickel chloride, and nickel acetate on corning glass substrates. X-ray diffraction show that the NiO films are polycrystalline and have a cubic crystal structure, although predominantly with a preferred 111-orientation in the growth direction and a random in-plane orientation. The deconvolution of the Ni 2p and O 1s core level X-ray photoelectron-spectra of nickel oxides produced by using different precursors indicates a shift of the binding energies. The sprayed NiO deposited from nickel nitrate has an optical transmittance in the range of 60-65% in the visible region. The optical band gap energies of the sprayed NiO films deposited from nickel nitrate, nickel chloride and nickel acetate are 3.5, 3.2 and 3.43 eV respectively. Also, the extinction coefficient and refractive index of NiO films have been calculated from transmittance and reflectance measurements. The average value of refractive index for sprayed films by nickel nitrate, nickel chloride and nickel acetate are 2.1, 1.6 and 1.85 respectively. It is revealed that the band gap and refractive index of NiO films by using nickel nitrate corresponds to the commonly reported values. We attribute the observed behavior in the optical band gap and optical constants as due to the change of the Ni/O ratio.

    The full text will be freely available from 2019-03-16 17:22
  • 15.
    Ahuja, R.
    et al.
    Condensed Matter Theory Group, Department of Physics, Uppsala University, P.O. Box 530, SE-751 21 Uppsala, Sweden.
    Ferreira, Da Silva A.
    Ferreira Da Silva, A., Instituto de Física, Universidade Federal da Bahia, Campus Universitario de Ondina, 40 210 340 Salvador, Ba, Brazil.
    Persson, C.
    Condensed Matter Theory Group, Department of Physics, Uppsala University, P.O. Box 530, SE-751 21 Uppsala, Sweden.
    Osorio-Guillen, J.M.
    Osorio-Guillén, J.M., Condensed Matter Theory Group, Department of Physics, Uppsala University, P.O. Box 530, SE-751 21 Uppsala, Sweden.
    Pepe, I.
    Instituto de Física, Universidade Federal da Bahia, Campus Universitario de Ondina, 40 210 340 Salvador, Ba, Brazil.
    Järrendahl, Kenneth
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Lindquist, O.P.A.
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Edwards, N.V.
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Wahab, Qamar Ul
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Johansson, B.
    Condensed Matter Theory Group, Department of Physics, Uppsala University, P.O. Box 530, SE-751 21 Uppsala, Sweden.
    Optical properties of 4H-SiC2002In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 91, no 3, 2099-2103 p.Article in journal (Refereed)
    Abstract [en]

    The optical band gap energy and the dielectric functions of n-type 4H-SiC have been investigated experimentally by transmission spectroscopy and spectroscopic ellipsometry and theoretically by an ab initio full-potential linear muffin-tin-orbital method. We present the real and imaginary parts of the dielectric functions, resolved into the transverse and longitudinal photon moment a, and we show that the anisotropy is small in 4H-SiC. The measurements and the calculations fall closely together in a wide range of energies. © 2002 American Institute of Physics.

  • 16.
    Aleksandrov, I.A.
    et al.
    Russian Academy of Science.
    Zhuravlev, K.S.
    Russian Academy of Science.
    Mansurov, V.G.
    Russian Academy of Science.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Linearly polarized photoluminescence from an ensemble of wurtzite GaN/AlN quantum dots2010In: JETP Letters: Journal of Experimental And Theoretical Physics Letters, ISSN 0021-3640, E-ISSN 1090-6487, Vol. 91, no 9, 452-454 p.Article in journal (Refereed)
    Abstract [en]

    Microphotoluminescence from GaN/AlN quantum dots grown by molecular beam epitaxy on sapphire substrates along the (0001) axis has been studied. To produce quantum dots of different average sizes and densities, the nominal amount of deposited GaN has been varied from 1 to 4 ML. The density of the quantum dots was about 10(11) cm(-2), which corresponded to about 10(3) quantum dots excited in the experiments. The photo-luminescence from the quantum dots was linearly polarized and the maximum polarization degree (15%) has been observed for the sample with the lowest amount of deposited GaN. The photoluminescence intensity from this sample under continuous laser excitation decreased by more than two orders of magnitude for about 30 min and then stabilized. The photoluminescence intensity from other samples under continuous excitation remained constant. We suggest that a rather high polarization degree is caused by anisotropy in the strain and shape of the quantum dots formed near the dislocations, which also act as the centers of nonradiative recombination.

  • 17. Aleksiejunas, R.
    et al.
    Jarasiunas, K.
    Kakanakova-Georgieva, Anelia
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Janzén, Erik
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Characterization of GaN/SiC epilayers by picosecond four-wave mixing technique2004In: Physica Scripta, Vol. T114, 2004, Vol. T114, 231-232 p.Conference paper (Refereed)
  • 18.
    Alexander-Webber, J. A.
    et al.
    University of Oxford, England.
    Baker, A. M. R.
    University of Oxford, England.
    Janssen, T. J. B. M.
    National Phys Lab, England.
    Tzalenchuk, A
    National Phys Lab, England.
    Lara-Avila, S
    Chalmers, Sweden.
    Kubatkin, S
    Chalmers, Sweden.
    Yakimova, Rositsa
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Piot, B A.
    LNCMI CNRS UJF INSA UPS, France.
    Maude, D K.
    LNCMI CNRS UJF INSA UPS, France.
    Nicholas, R J.
    University of Oxford, England.
    Phase Space for the Breakdown of the Quantum Hall Effect in Epitaxial Graphene2013In: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 111, no 9, e096601- p.Article in journal (Refereed)
    Abstract [en]

    We report the phase space defined by the quantum Hall effect breakdown in polymer gated epitaxial graphene on SiC (SiC/G) as a function of temperature, current, carrier density, and magnetic fields up to 30 T. At 2 K, breakdown currents (Ic) almost 2 orders of magnitude greater than in GaAs devices are observed. The phase boundary of the dissipationless state (ρxx=0) shows a [1-(T/Tc)2] dependence and persists up to Tc>45  K at 29 T. With magnetic field Ic was found to increase ∝B3/2 and TcB2. As the Fermi energy approaches the Dirac point, the ν=2 quantized Hall plateau appears continuously from fields as low as 1 T up to at least 19 T due to a strong magnetic field dependence of the carrier density.

  • 19.
    Alexander-Webber, J. A.
    et al.
    University of Oxford, England; University of Cambridge, England.
    Huang, J.
    University of Oxford, England.
    Maude, D. K.
    CNRS UGA UPS INSA, France.
    Janssen, T. J. B. M.
    National Phys Lab, England.
    Tzalenchuk, A.
    National Phys Lab, England; Royal Holloway University of London, England.
    Antonov, V.
    Royal Holloway University of London, England.
    Yager, T.
    Chalmers, Sweden.
    Lara-Avila, S.
    Chalmers, Sweden.
    Kubatkin, S.
    Chalmers, Sweden.
    Yakimova, Rositsa
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Nicholas, R. J.
    University of Oxford, England.
    Giant quantum Hall plateaus generated by charge transfer in epitaxial graphene2016In: Scientific Reports, ISSN 2045-2322, E-ISSN 2045-2322, Vol. 6, no 30296Article in journal (Refereed)
    Abstract [en]

    Epitaxial graphene has proven itself to be the best candidate for quantum electrical resistance standards due to its wide quantum Hall plateaus with exceptionally high breakdown currents. However one key underlying mechanism, a magnetic field dependent charge transfer process, is yet to be fully understood. Here we report measurements of the quantum Hall effect in epitaxial graphene showing the widest quantum Hall plateau observed to date extending over 50 T, attributed to an almost linear increase in carrier density with magnetic field. This behaviour is strong evidence for field dependent charge transfer from charge reservoirs with exceptionally high densities of states in close proximity to the graphene. Using a realistic framework of broadened Landau levels we model the densities of donor states and predict the field dependence of charge transfer in excellent agreement with experimental results, thus providing a guide towards engineering epitaxial graphene for applications such as quantum metrology.

  • 20.
    Alnoor, Hatim
    et al.
    Linköping University, Department of Science and Technology. Linköping University, Faculty of Science & Engineering.
    Chey, Chan Oeurn
    Linköping University, Department of Science and Technology, Physics and Electronics. Linköping University, The Institute of Technology.
    Pozina, Galia
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering.
    Liu, Xianjie
    Linköping University, Department of Physics, Chemistry and Biology, Surface Physics and Chemistry. Linköping University, Faculty of Science & Engineering.
    Khranovskyy, Volodymyr
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Willander, Magnus
    Linköping University, Department of Science and Technology, Physics and Electronics. Linköping University, Faculty of Science & Engineering.
    Nour, Omer
    Linköping University, Department of Science and Technology, Physics and Electronics. Linköping University, Faculty of Science & Engineering.
    Effect of precursor solutions stirring on deep level defects concentration and spatial distribution in low temperature aqueous chemical synthesis of zinc oxide nanorods2015In: AIP Advances, ISSN 2158-3226, E-ISSN 2158-3226, Vol. 5, no 8, 087180Article in journal (Refereed)
    Abstract [en]

    Hexagonal c-axis oriented zinc oxide (ZnO) nanorods (NRs) with 120-300 nm diameters are synthesized via the low temperature aqueous chemical route at 80 degrees C on silver-coated glass substrates. The influence of varying the precursor solutions stirring durations on the concentration and spatial distributions of deep level defects in ZnO NRs is investigated. Room temperature micro-photoluminesnce (mu-PL) spectra were collected for all samples. Cathodoluminescence (CL) spectra of the as-synthesized NRs reveal a significant change in the intensity ratio of the near band edge emission (NBE) to the deep-level emission (DLE) peaks with increasing stirring durations. This is attributed to the variation in the concentration of the oxygen-deficiency with increasing stirring durations as suggested from the X-ray photoelectron spectroscopy analysis. Spatially resolved CL spectra taken along individual NRs revealed that stirring the precursor solutions for relatively short duration (1-3 h), which likely induced high super saturation under thermodynamic equilibrium during the synthesis process, is observed to favor the formation of point defects moving towards the tip of the NRs. In contrary, stirring for longer duration (5-15 h) will induce low super saturation favoring the formation of point defects located at the bottom of the NRs. These findings demonstrate that it is possible to control the concentration and spatial distribution of deep level defects in ZnO NRs by varying the stirring durations of the precursor solutions.

  • 21.
    Alnoor, Hatim
    et al.
    Linköping University, Department of Science and Technology. Linköping University, Faculty of Science & Engineering.
    Pozina, Galia
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering.
    Khranovskyy, Volodymyr
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Liu, Xianjie
    Linköping University, Department of Physics, Chemistry and Biology, Surface Physics and Chemistry. Linköping University, Faculty of Science & Engineering.
    Iandolo, Donata
    Linköping University, Department of Science and Technology, Physics and Electronics. Linköping University, Faculty of Science & Engineering.
    Willander, Magnus
    Linköping University, Department of Science and Technology, Physics and Electronics. Linköping University, Faculty of Science & Engineering.
    Nur, Omer
    Linköping University, Department of Science and Technology, Physics and Electronics. Linköping University, Faculty of Science & Engineering.
    Influence of ZnO seed layer precursor molar ratio on the density of interface defects in low temperature aqueous chemically synthesized ZnO nanorods/GaN light-emitting diodes2016In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 119, no 16, 165702- p.Article in journal (Refereed)
    Abstract [en]

    Low temperature aqueous chemical synthesis (LT-ACS) of zinc oxide (ZnO) nanorods (NRs) has been attracting considerable research interest due to its great potential in the development of light-emitting diodes (LEDs). The influence of the molar ratio of the zinc acetate (ZnAc): KOH as a ZnO seed layer precursor on the density of interface defects and hence the presence of non-radiative recombination centers in LT-ACS of ZnO NRs/GaN LEDs has been systematically investigated. The material quality of the as-prepared seed layer as quantitatively deduced by the X-ray photoelectron spectroscopy is found to be influenced by the molar ratio. It is revealed by spatially resolved cathodoluminescence that the seed layer molar ratio plays a significant role in the formation and the density of defects at the n-ZnO NRs/p-GaN heterostructure interface. Consequently, LED devices processed using ZnO NRs synthesized with molar ratio of 1:5M exhibit stronger yellow emission (similar to 575 nm) compared to those based on 1:1 and 1:3M ratios as measured by the electroluminescence. Furthermore, seed layer molar ratio shows a quantitative dependence of the non-radiative defect densities as deduced from light-output current characteristics analysis. These results have implications on the development of high-efficiency ZnO-based LEDs and may also be helpful in understanding the effects of the ZnO seed layer on defect-related non-radiative recombination. Published by AIP Publishing.

  • 22.
    Amloy, Supaluck
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Polarization-resolved photoluminescence spectroscopy of III-nitride quantum dots2013Doctoral thesis, comprehensive summary (Other academic)
    Abstract [en]

    In this thesis, results from studies on (In)GaN quantum dots (QDs) are presented, including investigations of the structural, optical and electronic properties. The experimental studies were performed on GaN and InGaN QDs grown by molecular beam epitaxy, taking advantage of the Stranki-Krastanov growth mode for the GaN QD samples and the composition segregation for the InGaN QD samples.

    Optical spectroscopy of the (In)GaN QDs was performed with a combination of different experimental techniques, e.g. stationary microphotoluminescence (μPL) and timeresolved μPL. The μPL spectroscopy is suitable for studies of single QDs due to the wellfocused excitation laser spot, and it typically does not require any special sample preparation. The powerful combination of power and polarization dependences was used to distinguish the exciton and the biexciton emissions from other emission lines in the recorded spectra.

    The QDs could be observed with random in-plane anisotropy, as determined by the strong linear polarization for single QDs but with different angular orientation from dot to dot. Additionally, these experimental results are in good agreement with the computational results revealing a similar degree of polarization for the exciton and the biexciton emissions. Further, the theory predicts that the discrepancy of the polarization degree is larger between the positive and negative trions in comparison with the exciton and the biexciton. Based on this result, polarization resolved spectroscopy is proposed as a simple tool for the identification of trions and their charge states.

    The fine-structure splitting (FSS) and the biexciton binding energy (Ebxx) are essential QD parameters of relevance for the possible generation of quantum entangled photon pairs in a cascade recombination of the biexciton. In general, the Coulomb interaction between the negatively charged electron and the positively charged hole lifts the fourfold degeneracy of the electron and hole pair ground state, forming a set of zero-dimensional exciton states of unequal energies. This Coulomb-induced splitting, referred to as the FSS, results in an electronic fine structure, which is strongly dependent on the symmetry of the exciton wave function. The FSS was in this work resolved and investigated for excitons in InGaN QDs, using polarization-sensitive μPL spectroscopy employed on the cleaved-edge of the samples. As expected, the FSS is found to exhibit identical magnitudes, but with reversed sign for the exciton and the biexciton. For quantum information applications, a vanishing FSS is required, since otherwise the emissions of the polarization-entangled photon pairs in the cascade biexciton recombination will be prohibited.

    The biexcitons are found to exhibit both positive and negative binding energies for the investigated QDs. Since a negative binding energy indicates a repulsive Coulomb interaction, such biexcitons (or exciton complexes) cannot exist in structures of higher dimensionality. On the other hand, a biexciton with a negative binding energy can be found in QDs, since the exciton complexes still remain bound due to their three dimensional confinement. Moreover, the biexciton binding energy depends on the dot size, which implies that a careful size control of dots could enable manipulation of the biexciton binding energy. A large Ebxx value enables better and cheaper spectral filtering, in order to purify the single photon emission, while a proposed time reordering scheme relies on zero Ebxx for the generation of entangled photons.

    The dynamics of the exciton and the biexciton emissions from InGaN QD were measured by means of time-resolved μPL. The lifetimes of the exciton related emissions are demonstrated to depend on the dot size. Both the exciton and the biexciton emissions reveal mono-exponential decays, with a biexciton lifetime, which is about two times shorter than the exciton lifetime. This implies that the QD is small, with a size comparable to the exciton Bohr radius. The photon generation rates can be manipulated by controlling the QDs size, which in turn can be utilized for generation of single- and entangled-photons on demand, with a potential for applications in e.g. quantum information.

    The polarization of the emitted single photons can be manipulated by using a polarizer, but to the prize of photon loss and reduced emission intensity. Alternative methods to control the polarization of the emission light are a manipulation of the dot symmetry statically by its shape or dynamically by an externally applied electric field. Predictions based on performed calculations show that in materials with a small spin-orbit split-off energy (ΔSO), like the III-nitride materials, the polarization degree of the emission is more sensitive to dot asymmetry than in materials with a large value for ΔSO, e.g. the III-arsenide materials. Moreover, for an electric field applied in the 1͞10 and the 11͞2 directions of the zinc-blende lens-shaped QDs grown on the (111) plane, the polarization degree of InN QDs is found to be significantly more, by a factor of ~50 times, sensitive to the electric field than for GaN QDs. This work demonstrates that especially the InN based QD, are suitable for manipulation of the polarization by the direct control of the dot symmetry or by externally applied electric fields.

    List of papers
    1. Excitons and biexcitons in InGaN quantum dot like localization centers
    Open this publication in new window or tab >>Excitons and biexcitons in InGaN quantum dot like localization centers
    Show others...
    (English)Manuscript (preprint) (Other academic)
    Abstract [en]

    Indium segregation in a narrow InGaN single quantum well creates quantum dot (QD) like exciton localization centers. Cross section transmission electron microscopy reveals varying shapes and lateral sizes in the range ~1-5 nm of the QD-like features, while scanning near field optical microscopy demonstrates a highly inhomogeneous spatial distribution of optically active individual localization centers. Microphotoluminescence spectroscopy confirms the spectrally inhomogeneous distribution of localization centers, in which the exciton and the biexciton related emissions from single centers of varying geometry could be identified by means of excitation power dependencies. Interestingly, the biexciton binding energy (Ebxx) was found to vary from center to center, between 3 to -22 meV, in correlation with the exciton emission energy. Negative binding energies justify the three-dimensional quantum confinement, which confirms QD-like properties of the localization centers.! The observed energy correlation is proposed to be understood as variations of the lateral extension of the confinement potential, which would yield smaller values of Ebxx for reduced lateral extension and higher exciton emission energy. The proposed relation between lateral extension and Ebxx is further supported by the exciton and the biexciton recombination lifetimes of a single QD, which suggest a lateral extension of merely ~3 nm for a QD with strongly negative Ebxx = -15.5 meV.

    National Category
    Natural Sciences
    Identifiers
    urn:nbn:se:liu:diva-87746 (URN)
    Available from: 2013-01-22 Created: 2013-01-22 Last updated: 2016-06-07
    2. Dynamic characteristics of the exciton and the biexciton in a single InGaN quantum dot
    Open this publication in new window or tab >>Dynamic characteristics of the exciton and the biexciton in a single InGaN quantum dot
    Show others...
    2012 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 101, no 6Article in journal (Refereed) Published
    Abstract [en]

    The dynamics of the exciton and the biexciton related emission from a single InGaN quantum dot (QD) have been measured by time-resolved microphotoluminescence spectroscopy. An exciton-biexciton pair of the same QD was identified by the combination of power dependence and polarization-resolved spectroscopy. Moreover, the spectral temperature evolution was utilized in order to distinguish the biexciton from a trion. Both the exciton and the biexciton related emission reveal mono-exponential decays corresponding to time constants of similar to 900 and similar to 500 ps, respectively. The obtained lifetime ratio of similar to 1.8 indicates that the QD is small, with a size comparable to the exciton Bohr radius.

    Place, publisher, year, edition, pages
    American Institute of Physics (AIP), 2012
    National Category
    Engineering and Technology
    Identifiers
    urn:nbn:se:liu:diva-84908 (URN)10.1063/1.4742343 (DOI)000307862400022 ()
    Note

    Funding Agencies|Thaksin University in Thailand||Swedish Research Council (VR)||Swedish Foundation for Strategic Research (SSF)||Knut and Alice Wallenberg Foundation||

    Available from: 2012-10-26 Created: 2012-10-26 Last updated: 2017-12-07
    3. Polarization-resolved fine-structure splitting of zero-dimensional InxGa1-xN excitons
    Open this publication in new window or tab >>Polarization-resolved fine-structure splitting of zero-dimensional InxGa1-xN excitons
    Show others...
    2011 (English)In: PHYSICAL REVIEW B, ISSN 1098-0121, Vol. 83, no 20, 201307- p.Article in journal (Refereed) Published
    Abstract [en]

    The fine-structure splitting of quantum confined InxGa1-x Nexcitons is investigated using polarization-sensitive photoluminescence spectroscopy. The majority of the studied emission lines exhibits mutually orthogonal fine-structure components split by 100-340 mu eV, as measured from the cleaved edge of the sample. The exciton and the biexciton reveal identical magnitudes but reversed sign of the energy splitting.

    Place, publisher, year, edition, pages
    American Physical Society, 2011
    National Category
    Engineering and Technology
    Identifiers
    urn:nbn:se:liu:diva-68780 (URN)10.1103/PhysRevB.83.201307 (DOI)000290715600002 ()
    Note
    Original Publication: Supaluck Amloy, Y T Chen, K F Karlsson, K H Chen, H C Hsu, C L Hsiao, L C Chen and Per-Olof Holtz, Polarization-resolved fine-structure splitting of zero-dimensional InxGa1-xN excitons, 2011, PHYSICAL REVIEW B, (83), 20, 201307. http://dx.doi.org/10.1103/PhysRevB.83.201307 Copyright: American Physical Society http://www.aps.org/ Available from: 2011-06-08 Created: 2011-06-07 Last updated: 2015-01-23
    4. On the polarized emission from exciton complexes in GaN quantum dots
    Open this publication in new window or tab >>On the polarized emission from exciton complexes in GaN quantum dots
    2012 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 100, no 021901Article in journal (Refereed) Published
    Abstract [en]

    The optical linear polarization properties of exciton complexes in asymmetric Stranski-Krastanov grown GaN quantum dots have been investigated experimentally and theoretically. It is demonstrated that the polarization angle and the polarization degree can be conveniently employed to associate emission lines in the recorded photoluminescence spectra to a specific dot. The experimental results are in agreement with configuration interaction computations, which predict similar polarization degrees for the exciton and the biexciton (within 10%) in typical GaN quantum dots. The theory further predicts that the polarization degree can provide information about the charge state of the dot.

    Place, publisher, year, edition, pages
    American Institute of Physics (AIP), 2012
    Keyword
    biexcitons, gallium compounds, III-V semiconductors, light polarisation, photoluminescence, semiconductor quantum dots, wide band gap semiconductors
    National Category
    Engineering and Technology
    Identifiers
    urn:nbn:se:liu:diva-73599 (URN)10.1063/1.3675572 (DOI)000299126800013 ()
    Note
    funding agencies|Thaksin University in Thailand||Swedish Research Council (VR)||Swedish Foundation for Strategic Research (SSF)||Knut and Alice Wallenberg Foundation||Available from: 2012-01-10 Created: 2012-01-10 Last updated: 2017-12-08
    5. Size dependent biexciton binding energies in GaN quantum dots
    Open this publication in new window or tab >>Size dependent biexciton binding energies in GaN quantum dots
    Show others...
    2011 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 25, no 251903Article in journal (Refereed) Published
    Abstract [en]

    Single GaN/Al(Ga)N quantum dots (QDs) have been investigated by means of microphotoluminescence. Emission spectra related to excitons and biexcitons have been identified by excitation power dependence and polarization resolved spectroscopy. All investigated dots exhibit a strong degree of linear polarization (∼90%). The biexciton binding energy scales with the dot size. However, both positive and negative binding energies are found for the studied QDs. These results imply that careful size control of III-Nitride QDs would enable the emission of correlated photons with identical frequencies from the cascade recombination of the biexciton, with potential applications in the area of quantum information processing.

    Place, publisher, year, edition, pages
    American Institute of Physics (AIP), 2011
    National Category
    Engineering and Technology
    Identifiers
    urn:nbn:se:liu:diva-73545 (URN)10.1063/1.3670040 (DOI)000299031600019 ()
    Note

    funding agencies|Thaksin University in Thailand||Swedish Research Council (VR)||Swedish Foundation for Strategic Research (SSF)||Knut and Alice Wallenberg Foundation||

    Available from: 2012-01-09 Created: 2012-01-09 Last updated: 2017-12-08
    6. III-nitride based quantum dots for photon emission with controlled polarization switching
    Open this publication in new window or tab >>III-nitride based quantum dots for photon emission with controlled polarization switching
    (English)Manuscript (preprint) (Other academic)
    Abstract [en]

    Computational studies based on 6 band k⋅p!theory are employed on lens-shaped III-nitride quantum dots (QDs) with focus on the polarization properties of the optical interband transitions. The results predict pronounced linear polarization of the ground-state related transitions for asymmetric QDs of a material with small split-off energy. It is demonstrated that a moderate externally applied electric field can be used to induce a linear polarization and to control its direction. InN is found to be the most efficient choice for dynamic polarization switching controlled by an electric field, with potential for polarization control on a photon-by-photon level.

    National Category
    Natural Sciences
    Identifiers
    urn:nbn:se:liu:diva-87747 (URN)
    Available from: 2013-01-22 Created: 2013-01-22 Last updated: 2016-06-07Bibliographically approved
  • 23.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Chen, Y T
    Acad Sinica, Taiwan .
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Chen, K H
    Acad Sinica, Taiwan .
    Hsu, H C
    National Taiwan University.
    Hsiao, C L
    National Taiwan University.
    Chen, L C
    National Taiwan University.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Polarization-resolved fine-structure splitting of zero-dimensional InxGa1-xN excitons2011In: PHYSICAL REVIEW B, ISSN 1098-0121, Vol. 83, no 20, 201307- p.Article in journal (Refereed)
    Abstract [en]

    The fine-structure splitting of quantum confined InxGa1-x Nexcitons is investigated using polarization-sensitive photoluminescence spectroscopy. The majority of the studied emission lines exhibits mutually orthogonal fine-structure components split by 100-340 mu eV, as measured from the cleaved edge of the sample. The exciton and the biexciton reveal identical magnitudes but reversed sign of the energy splitting.

  • 24.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Andersson, T. G.
    Applied Semiconductor Physics, Department of Microtechnology and Nanoscience, Chalmers University.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    On the polarized emission from exciton complexes in GaN quantum dots2012In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 100, no 021901Article in journal (Refereed)
    Abstract [en]

    The optical linear polarization properties of exciton complexes in asymmetric Stranski-Krastanov grown GaN quantum dots have been investigated experimentally and theoretically. It is demonstrated that the polarization angle and the polarization degree can be conveniently employed to associate emission lines in the recorded photoluminescence spectra to a specific dot. The experimental results are in agreement with configuration interaction computations, which predict similar polarization degrees for the exciton and the biexciton (within 10%) in typical GaN quantum dots. The theory further predicts that the polarization degree can provide information about the charge state of the dot.

  • 25.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    III-nitride based quantum dots for photon emission with controlled polarization switchingManuscript (preprint) (Other academic)
    Abstract [en]

    Computational studies based on 6 band k⋅p!theory are employed on lens-shaped III-nitride quantum dots (QDs) with focus on the polarization properties of the optical interband transitions. The results predict pronounced linear polarization of the ground-state related transitions for asymmetric QDs of a material with small split-off energy. It is demonstrated that a moderate externally applied electric field can be used to induce a linear polarization and to control its direction. InN is found to be the most efficient choice for dynamic polarization switching controlled by an electric field, with potential for polarization control on a photon-by-photon level.

  • 26.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Palisaitis, Justinas
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
    Persson, Per
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
    Chen, Y. T.
    Institute of Atomic and Molecular Sciences, Academia Sinica, Taiwan.
    Chen, K. H.
    Institute of Atomic and Molecular Sciences, Academia Sinica, Taiwan.
    Hsu, H. C.
    Center for Condensed Matter Sciences, National Taiwan University, Taiwan.
    Hsiao, C. L.
    Center for Condensed Matter Sciences, National Taiwan.
    Chen, L. C.
    Center for Condensed Matter Sciences, National Taiwan.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Excitons and biexcitons in InGaN quantum dot like localization centersManuscript (preprint) (Other academic)
    Abstract [en]

    Indium segregation in a narrow InGaN single quantum well creates quantum dot (QD) like exciton localization centers. Cross section transmission electron microscopy reveals varying shapes and lateral sizes in the range ~1-5 nm of the QD-like features, while scanning near field optical microscopy demonstrates a highly inhomogeneous spatial distribution of optically active individual localization centers. Microphotoluminescence spectroscopy confirms the spectrally inhomogeneous distribution of localization centers, in which the exciton and the biexciton related emissions from single centers of varying geometry could be identified by means of excitation power dependencies. Interestingly, the biexciton binding energy (Ebxx) was found to vary from center to center, between 3 to -22 meV, in correlation with the exciton emission energy. Negative binding energies justify the three-dimensional quantum confinement, which confirms QD-like properties of the localization centers.! The observed energy correlation is proposed to be understood as variations of the lateral extension of the confinement potential, which would yield smaller values of Ebxx for reduced lateral extension and higher exciton emission energy. The proposed relation between lateral extension and Ebxx is further supported by the exciton and the biexciton recombination lifetimes of a single QD, which suggest a lateral extension of merely ~3 nm for a QD with strongly negative Ebxx = -15.5 meV.

  • 27.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology. Thaksin University, Thailand.
    Karlsson, K. Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Eriksson, Martin O
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Palisaitis, Justinas
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
    Persson, Per O. Å.
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
    Chen, Y. T.
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology. Academia Sinica, Taiwan .
    Chen, K. H.
    Academia Sinica, Taiwan; National Taiwan University, Taiwan.
    Hsu, H. C.
    National Taiwan University, Taiwan.
    Hsiao, C. L.
    Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology. National Taiwan University, Taiwan.
    Chen, L. C.
    National Taiwan University, Taiwan.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Excitons and biexcitons in InGaN quantum dot like localization centers2014In: Nanotechnology, ISSN 0957-4484, Vol. 25, no 49, 495702- p.Article in journal (Refereed)
    Abstract [en]

    Indium segregation in a narrow InGaN single quantum well creates quantum dot (QD) like exciton localization centers. Cross-section transmission electron microscopy reveals varying shapes and lateral sizes in the range ∼1–5 nm of the QD-like features, while scanning near field optical microscopy demonstrates a highly inhomogeneous spatial distribution of optically active individual localization centers. Microphotoluminescence spectroscopy confirms the spectrally inhomogeneous distribution of localization centers, in which the exciton and the biexciton related emissions from single centers of varying geometry could be identified by means of excitation power dependencies. Interestingly, the biexciton binding energy (Ebxx) was found to vary from center to center, between 3 to −22 meV, in correlation with the exciton emission energy. Negative binding energies are only justified by a three-dimensional quantum confinement, which confirms QD-like properties of the localization centers. The observed energy correlation is proposed to be understood as variations of the lateral extension of the confinement potential, which would yield smaller values of Ebxx for reduced lateral extension and higher exciton emission energy. The proposed relation between lateral extension and Ebxx is further supported by the exciton and the biexciton recombination lifetimes of a single QD, which suggest a lateral extension of merely ∼3 nm for a QD with strongly negative Ebxx = −15.5 meV. 

  • 28.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Moskalenko, Evgenii
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Eriksson, M
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Karlsson, K Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Chen, Y T
    Academic Sinica, Taiwan .
    Chen, K H
    Academic Sinica, Taiwan National Taiwan University, Taiwan .
    Hsu, H C
    National Taiwan University, Taiwan .
    Hsiao, C L
    National Taiwan University, Taiwan .
    Chen, L C
    National Taiwan University, Taiwan .
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Dynamic characteristics of the exciton and the biexciton in a single InGaN quantum dot2012In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 101, no 6Article in journal (Refereed)
    Abstract [en]

    The dynamics of the exciton and the biexciton related emission from a single InGaN quantum dot (QD) have been measured by time-resolved microphotoluminescence spectroscopy. An exciton-biexciton pair of the same QD was identified by the combination of power dependence and polarization-resolved spectroscopy. Moreover, the spectral temperature evolution was utilized in order to distinguish the biexciton from a trion. Both the exciton and the biexciton related emission reveal mono-exponential decays corresponding to time constants of similar to 900 and similar to 500 ps, respectively. The obtained lifetime ratio of similar to 1.8 indicates that the QD is small, with a size comparable to the exciton Bohr radius.

  • 29.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Yu, K. H.
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Farivar, R
    Applied Semiconductor Physics, Department of Microtechnology and Nanoscience, Chalmers University of Technology, S-41296 Göteborg, Sweden .
    Andersson, T. G.
    Applied Semiconductor Physics, Department of Microtechnology and Nanoscience, Chalmers University of Technology, S-41296 Göteborg, Sweden .
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Size dependent biexciton binding energies in GaN quantum dots2011In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 25, no 251903Article in journal (Refereed)
    Abstract [en]

    Single GaN/Al(Ga)N quantum dots (QDs) have been investigated by means of microphotoluminescence. Emission spectra related to excitons and biexcitons have been identified by excitation power dependence and polarization resolved spectroscopy. All investigated dots exhibit a strong degree of linear polarization (∼90%). The biexciton binding energy scales with the dot size. However, both positive and negative binding energies are found for the studied QDs. These results imply that careful size control of III-Nitride QDs would enable the emission of correlated photons with identical frequencies from the cascade recombination of the biexciton, with potential applications in the area of quantum information processing.

  • 30.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology. Department of Physics, Faculty of Science, Thaksin University, 93110 Phattalung, Thailand .
    Yu, K. H.
    Linköping University, Department of Physics, Chemistry and Biology.
    Karlsson, K Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Farivar, R.
    Applied Semiconductor Physics, Department of Microtechnology and Nanoscience, Chalmers University of Technology, S‐41296 Göteborg, Sweden.
    Andersson, T. G.
    Applied Semiconductor Physics, Department of Microtechnology and Nanoscience, Chalmers University of Technology, S‐41296 Göteborg, Sweden.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Polarized Emission from Single GaN Quantum Dots Grown by Molecular Beam Epitaxy2011Conference paper (Other academic)
    Abstract [en]

    Polarization resolved microphotoluminescence measurements of single MBE‐grown GaN/Al(Ga)N quantum dots (QDs) have been performed. The exciton and biexciton peaks with full width at half maximum as narrow as <500 μeV  were observed. Interestingly, there exist both positive and negative binding energies of the biexciton, explained in term of different sizes of the measured dots, resulting in different built‐in electric field. Moreover, a strongly linearly polarized emission is observed for the investigated dots with a degree of linear polarization of about 0.9, interpreted as the valence‐band mixing induced by in‐plane anisotropy due to strain and/or QD shape.

  • 31.
    Amloy, Supaluck
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology. Department of Physics, Faculty of Science, Thaksin University, 93110 Phattalung, Thailand .
    Yu, K.H.
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Karlsson, Fredrik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Farivar, R
    Applied Semiconductor Physics, Department of Microtechnology and Nanoscience, Chalmers University of Technology, Göteborg, Sweden.
    Andersson, Torwald
    Applied Semiconductor Physics, Department of Microtechnology and Nanoscience, Chalmers University of Technology, Göteborg, Sweden.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Polarized Emission from Single GaN Quantum Dot Grown by Molecular Beam Epitaxy2011Conference paper (Refereed)
    Abstract [en]

    Polarization resolved microphotoluminescence measurements of single MBE‐grown GaN∕Al(Ga)N quantum dots (QDs) have been performed. The exciton and biexciton peaks with full width at half maximum as narrow as <500 μeV were observed. Interestingly, there exist both positive and negative binding energies of the biexciton, explained in term of different sizes of the measured dots, resulting in different built‐in electric field. Moreover, a strongly linearly polarized emission is observed for the investigated dots with a degree of linear polarization of about 0.9, interpreted as the valence‐band mixing induced by in‐plane anisotropy due to strain and∕or QD shape.

  • 32.
    Andersson, Christer M
    et al.
    Microwave Electronics Laboratory, Chalmers University of Technology, Gothenburg.
    Ejebjörk, Niclas
    Microwave Electronics Laboratory, Chalmers University of Technology, Gothenburg.
    Henry, Anne
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Andersson, Sven
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Janzén, Erik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Zirath, Herbert
    Microwave Electronics Laboratory, Chalmers University of Technology, Gothenburg.
    Rorsman, Niklas
    Microwave Electronics Laboratory, Chalmers University of Technology, Gothenburg.
    A SiC Varactor With Large Effective Tuning Range for Microwave Power Applications2011In: IEEE ELECTRON DEVICE LETTERS, ISSN 0741-3106, Vol. 32, no 6, 788-790 p.Article in journal (Refereed)
    Abstract [en]

    SiC Schottky diode varactors have been fabricated for use in microwave power applications, specifically the dynamic load modulation of power amplifiers. A custom doping profile has been employed to spread the C(V) over a large bias voltage range, thereby increasing the effective tuning range under large voltage swing conditions. The small-signal tuning range is approximately six, and punch through is reached at a bias voltage of -60 V, while the breakdown voltage is on the order of -160 V. An interdigitated layout is utilized together with a self-aligned Schottky anode etch process to improve the Q-factor at 2 GHz, which is 20 at zero bias and approximately 160 at punch through.

  • 33.
    Andersson, J. Y.
    et al.
    Acreo AB.
    Hoglund, L.
    Acreo AB .
    Noharet, B.
    Acreo AB.
    Wang, Q.
    Acreo AB.
    Ericsson, P.
    Acreo AB.
    Wissmar, S.
    Acreo AB.
    Asplund, C.
    IRnova AB.
    Malm, H.
    IRnova AB.
    Martijn, H.
    IRnova AB.
    Hammar, M.
    Royal Institute of Technology, Stockholm.
    Gustafsson, O.
    Royal Institute of Technology, Stockholm.
    Hellstrom, S.
    Royal Institute of Technology, Stockholm.
    Radamson, H.
    Royal Institute of Technology, Stockholm.
    Holtz, Per-Olof
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Quantum structure based infrared detector research and development within Acreos centre of excellence IMAGIC2010In: Infrared physics & technology, ISSN 1350-4495, E-ISSN 1879-0275, Vol. 53, no 4, 227-230 p.Article in journal (Refereed)
    Abstract [en]

    Acreo has a long tradition of working with quantum structure based infrared (IR) detectors and arrays. This includes QWIP (quantum well infrared photodetector), QDIP (quantum dot infrared photodetector), and InAs/GaInSb based photon detectors of different structure and composition. It also covers RandD on uncooled microbolometers. The integrated thermistor material of such detectors is advantageously based on quantum structures that are optimised for high temperature coefficient and low noise. Especially the SiGe material system is preferred due to the compatibility with silicon technology. The RandD work on IR detectors is a prominent part of Acreos centre of excellence "IMAGIC" on imaging detectors and systems for non-visible wavelengths. IMAGIC is a collaboration between Acreo, several industry partners and universities like the Royal Institute of Technology (KTH) and Linkoping University.

  • 34.
    Ao, Xiang
    et al.
    Huazhong University of Science and Technology, Peoples R China.
    Jiang, Jianjun
    Huazhong University of Science and Technology, Peoples R China.
    Ruan, Yunjun
    Huazhong University of Science and Technology, Peoples R China.
    Li, Zhishan
    Huazhong University of Science and Technology, Peoples R China.
    Zhang, Yi
    Wuhan Institute Technology, Peoples R China.
    Sun, Jianwu
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Wang, Chundong
    Huazhong University of Science and Technology, Peoples R China; Chinese Academic Science, Peoples R China.
    Honeycomb-inspired design of ultrafine SnO2@C nanospheres embedded in carbon film as anode materials for high performance lithium- and sodium-ion battery2017In: Journal of Power Sources, ISSN 0378-7753, E-ISSN 1873-2755, Vol. 359, 340-348 p.Article in journal (Refereed)
    Abstract [en]

    Tin oxide (SnO2) has been considered as one of the most promising anodes for advanced rechargeable batteries due to its advantages such as high energy density, earth abundance and environmental friendly. However, its large volume change during the Li-Sn/Na-Sn alloying and de-alloying processes will result in a fast capacity degradation over a long term cycling. To solve this issue, in this work we design and synthesize a novel honeycomb-like composite composing of carbon encapsulated SnO2 nanospheres embedded in carbon film by using dual templates of SiO2 and NaCl. Using these composites as anodes both in lithium ion batteries and sodium-ion batteries, no discernable capacity degradation is observed over hundreds of long term cycles at both low current density (100 mA g(-1)) and high current density (500 mA g(-1)). Such a good cyclic stability and high delivered capacity have been attributed to the high conductivity of the supported carbon film and hollow encapsulated carbon shells, which not only provide enough space to accommodate the volume expansion but also prevent further aggregation of SnO2 nanoparticles upon cycling. By engineering electrodes of accommodating high volume expansion, we demonstrate a prototype to achieve high performance batteries, especially high-power batteries. (C) 2017 Elsevier B.V. All rights reserved.

    The full text will be freely available from 2019-06-09 14:10
  • 35.
    Aradi, B.
    et al.
    Department of Atomic Physics, Budapest Univ. of Technol. and Econ., Budafoki út 8, Budapest, H-1111, Hungary.
    Deak, P.
    Deák, P., Department of Atomic Physics, Budapest Univ. of Technol. and Econ., Budafoki út 8, Budapest, H-1111, Hungary.
    Nguyen, Tien Son
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Janzén, Erik
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Choyke, W.J.
    Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260, United States.
    Devaty, R.P.
    Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260, United States.
    Impurity-controlled dopant activation: Hydrogen-determined site selection of boron in silicon carbide2001In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 79, no 17, 2746-2748 p.Article in journal (Refereed)
    Abstract [en]

    The geometry and formation energy of substitutional B and Al dopants as well as their complexes with hydrogen have been calculated in 4H-SiC using first-principles methods. Our results show that boron selecting the silicon site and, therefore, getting activated as a shallow acceptor depends on the presence of hydrogen which is promoted into the crystal by boron itself. Without hydrogen, boron would mostly be incorporated at the carbon site. Aluminum does not show this behavior: it always selects the silicon site and is incorporated independently of hydrogen. © 2001 American Institute of Physics.

  • 36.
    Aradi, B
    et al.
    Tech Univ Budapest, Dept Atom Phys, HU-1111 Budapest, Hungary Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden.
    Gali, Adam
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
    Deak, P
    Tech Univ Budapest, Dept Atom Phys, HU-1111 Budapest, Hungary Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden.
    Nguyen, Tien Son
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Janzén, Erik
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Impurity-controlled dopant activation - The role of hydrogen in p-type doping of SiC2002In: Materials Science Forum, Vols. 389-393, 2002, Vol. 389-3, 561-564 p.Conference paper (Refereed)
    Abstract [en]

    Hydrogen is a natural contaminant of SiC growth processes, and may influence the doping efficiency. Hydrogen incorporation proportional to that of boron was observed during CVD growth while the amount of hydrogen was two orders of magnitude less than the aluminum concentration. Passivation by complex formation with hydrogen has been proven both for Al and B. The experimentally observed reactivation energy of these complexes differ by 0.9 eV. Our ab initio supercell calculations in 4H-SiC indicate, that in the absence of hydrogen, boron is incorporated as isolated substitutional and prefers the carbon site, while under typical CVD conditions boron is incorporated together with hydrogen (in equal amounts), favoring the silicon site. Therefore, the presence of H is advantageous for the activation of B as a shallow acceptor. In contrast to boron, aluminum is incorporated independently of the presence of hydrogen as isolated substitutional at the silicon site. The calculated difference between the dissociation of the stable dopant plus hydrogen complexes agrees very well with experiments. Vibration frequencies for the dopant complexes have been also calculated.

  • 37.
    Aradi, B.
    et al.
    Department of Atomic Physics, Budapest University of Technology and Economics, Budafoki út 8, H-1111 Budapest, Hungary.
    Gali, Adam
    Department of Atomic Physics, Budapest Univ. of Technol./Economics, Budafoki út 8, H-1111 Budapest, Hungary.
    Deak, P.
    Deák, P., Department of Atomic Physics, Budapest University of Technology and Economics, Budafoki út 8, H-1111 Budapest, Hungary.
    Nguyen, Tien Son
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Janzén, Erik
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Passivation of p-type dopants in 4H-SiC by hydrogen2001In: Physica B, Vols. 308-310, 2001, Vol. 308-310, 722-725 p.Conference paper (Refereed)
    Abstract [en]

    Experimental investigations showed passivation of the p-type dopants B and Al in 4H-SiC by the formation of B+H and Al+H complexes. The dissociation energies of these complexes differed by 0.9 eV. Ab initio supercell calculations have been performed to investigate the interaction of H with B and Al in hexagonal 4H-SiC. The total energy, geometry and electronic structure of the possible complexes have been determined. Site dependencies have also been investigated. The most stable configurations were found with H at a bond center site next to B at the Si site, and with H at the antibonding site of a carbon atom which is first neighbor to Al at a Si site. Both the BSi+HBC and the AlSi+HAB(C) complexes turned out to be electrically inactive. The different structure of the passivated complexes explains the observed difference in their dissociation energy: the calculated difference of the binding energies of these complexes is 0.9 eV, which agrees well with the experimental finding. © 2001 Elsevier Science B.V. All rights reserved.

  • 38.
    Aradi, B
    et al.
    Tech Univ Budapest, Dept Atom Phys, HU-1111 Budapest, Hungary Univ Gesamthsch Paderborn, Dept Phys, DE-33095 Paderborn, Germany Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden.
    Gali, Adam
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
    Deak, P
    Tech Univ Budapest, Dept Atom Phys, HU-1111 Budapest, Hungary Univ Gesamthsch Paderborn, Dept Phys, DE-33095 Paderborn, Germany Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden.
    Rauls, E
    Tech Univ Budapest, Dept Atom Phys, HU-1111 Budapest, Hungary Univ Gesamthsch Paderborn, Dept Phys, DE-33095 Paderborn, Germany Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden.
    Frauenheim, T
    Tech Univ Budapest, Dept Atom Phys, HU-1111 Budapest, Hungary Univ Gesamthsch Paderborn, Dept Phys, DE-33095 Paderborn, Germany Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden.
    Nguyen, Tien Son
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Boron centers in 4H-SiC2001In: Materials science Forum, Vols. 353-356, 2001, Vol. 353-356, 455-458 p.Conference paper (Refereed)
    Abstract [en]

    The origin of the "deep boron related acceptor level" in SIC is subject to a lot of controversy. Based on ENDOR investigations, a B-Si+V-C model was suggested, while PL studies indicated the acceptor on the carbon sublattice. Our former ab initio LDA molecular cluster calculation showed that in the B-Si+V-C complex the carbon vacancy acts as the acceptor. Now, ah initio LDA supercell calculations have been carried out for boron-related complexes to calculate the occupation levels in 4H-SiC. It has been found that the 0/- level for the B-Si+V-C complex lies in the upper half of the gap, therefore it can be disregarded as the origin of the "deep boron-related acceptor level". Investigating other feasible boron-related complexes, B-Si+Si-C appears to be the best candidate.

  • 39.
    Ariyawong, Kanaparin
    et al.
    Laboratoire des Matériaux et du Génie Physique, Grenoble INP – CNRS, France.
    Jokubavicius, Valdas
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Liljedahl, Rickard
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Syväjärvi, Mikael
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Step Instability in Sublimation Epitaxy on Low Off-Axis 6H-SiC2013Conference paper (Refereed)
  • 40.
    Armakavicius, Nerijus
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Study of novel electronic materials by mid-infrared and terahertz optical Hall effect2017Licentiate thesis, comprehensive summary (Other academic)
    Abstract [en]

    Development of silicon based electronics have revolutionized our every day life during the last three decades. Nowadays Si based devices operate close to their theoretical limits that is becoming a bottleneck for further progress. In particular, for the growing field of high frequency and high power electronics, Si cannot offer the required properties. Development of materials capable of providing high current densities, carrier mobilities and high breakdown fields is crucial for a progress in state of the art electronics.

    Epitaxial graphene grown on semi-insulating silicon carbide substrates has a high potential to be integrated in the current planar device technologies. High electron mobilities and sheet carrier densities make graphene extremely attractive for high frequency analog applications. One of the remaining challenges is the interaction of epitaxial graphene with the substrate. Typically, much lower free charge carrier mobilities, compared to free standing graphene, and doping, due to charge transfer from the substrate, is reported. Thus, a good understanding of the intrinsic free charge carriers properties and the factors affecting them is very important for further development of epitaxial graphene.

    III-group nitrides have been extensively studied and already have proven their high efficiency as light sources for short wavelengths. High carrier mobilities and breakdown electric fields were demonstrated for III-group nitrides, making them attractive for high frequency and high power applications. Currently, In-rich InGaN alloys and AlGaN/GaN high electron mobility structures are of high interest for the research community due to open fundamental questions.

    Electrical characterization techniques, commonly used for the determination of free charge carrier properties, require good ohmic and Schottky contacts, which in certain cases can be difficult to achieve. Access to electrical properties of buried conductive channels in multilayered structures requires modification of samples and good knowledge of the electrical properties of all electrical contact within the structure. Moreover, the use of electrical contacts to electrically characterize two-dimensional electronic materials, such as graphene, can alter their intrinsic properties. Furthermore, the determination of effective mass parameters commonly employs cyclotron resonance and Shubnikov-de Haas oscillations measurements, which require long scattering times of free charge carriers, high magnetic fields and low temperatures.

    The optical Hall effect is an external magnetic field induced optical anisotropy in  conductive layers due to the motion of the free charge carriers under the influence of the Lorentz force, and is equivalent to the electrical Hall effect at optical frequencies. The optical Hall effect can be measured by generalized ellipsometry and provides a powerful method for the determination of free charge carrier properties in a non-destructive and contactless manner. In principle, a single optical Hall effect measurement can provide quantitative information about free charge carrier types, concentrations, mobilities and effective mass parameters at temperatures ranging from few kelvins to room temperature and above. Further, it was demonstrated that for transparent samples, a backside cavity can be employed to enhance the optical Hall effect.

    Measurement of the optical Hall effect by generalized ellipsometry is an indirect technique requiring subsequent data analysis. Parameterized optical models are fitted to match experimentally measured ellipsometric data by varying physically significant parameters. Analysis of the optical response of samples, containing free charge carriers, employing optical models based on the classical Drude model, which is augmented with an external magnetic field contribution, provide access to the free charge carrier properties.

    The main research results of the graduate studies presented in this licentiate thesis are summarized in the five scientific papers.

    Paper I. Description of the custom-built terahertz frequency-domain spectroscopic ellipsometer at Linköping University. The terahertz ellipsometer capabilities are demonstrated by an accurate determination of the isotropic and anisotropic refractive indices of silicon and m-plane sapphire, respectively. Further, terahertz optical Hall effect measurements of an AlGaN/GaN high electron mobility structures were employed to extract the two-dimensional electron gas sheet density, mobility and effective mass parameters. Last, in-situ optical Hall effect measurement on epitaxial graphene in a gas cell with controllable environment, were used to study the effects of environmental doping on the mobility and carrier concentration.

    Paper II. Presents terahertz cavity-enhanced optical Hall measurements of the monolayer and multilayer epitaxial graphene on semi-insulating 4H-SiC (0001) substrates. The data analysis revealed p-type doping for monolayer graphene with a carrier density in the low 1012 cm−2 range and a carrier mobility of 1550 cm2/V·s. For the multilayer epitaxial graphene, n-type doping with a carrier density in the low 1013 cm−2 range, a mobility of 470 cm2/V·s and an effective mass of (0.14 ± 0.03) m0 were extracted. The measurements demonstrate that cavity-enhanced optical Hall effect measurements can be applied to study electronic properties of two-dimensional materials.

    Paper III. Terahertz cavity-enhanced optical Hall effect measurements are employed to study anisotropic transport in as-grown monolayer, quasi free-standing monolayer and quasi free-standing bilayer epitaxial graphene on semi-insulating 4H-SiC (0001) substrates. The data analysis revealed a strong anisotropy in the carrier mobilities of the quasi freestanding bilayer graphene. The anisotropy is demonstrated to be induced by carriers scattering at the step edges of the SiC, by showing that the mobility is higher along the step than across them. The scattering mechanism is discussed based on the results of the optical Hall effect, low-energy electron microscopy, low-energy electron diffraction and Raman measurements.

    Paper IV. Mid-infrared spectroscopic ellipsometry and mid-infrared optical Hall effect measurements are employed to determine the electron effective mass in an In0.33Ga0.67N epitaxial layer. The data analysis reveals slightly anisotropic effective mass and carrier mobility parameters together with the optical phonon frequencies and broadenings.

    Paper V. Terahertz cavity-enhanced optical Hall measurements are employed to study the free charge carrier properties in a set of AlGaN/GaN high electron mobility structures with modified interfaces. The results show that the interface structure has a significant effect on the free charge carrier mobility and that the sample with a sharp interface between an AlGaN barrier and a GaN buffer layers exhibits a record mobility of 2332±73 cm2/V·s. The determined effective mass parameters showed an increase compared to the GaN value, that is attributed the the penetration of the electron wavefunction into the AlGaN barrier layer.

    List of papers
    1. Cavity-enhanced optical Hall effect in epitaxial graphene detected at terahertz frequencies
    Open this publication in new window or tab >>Cavity-enhanced optical Hall effect in epitaxial graphene detected at terahertz frequencies
    Show others...
    2017 (English)In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 421, 357-360 p.Article in journal (Refereed) Published
    Abstract [en]

    Cavity-enhanced optical Hall effect at terahertz (THz) frequencies is employed to determine the free charge carrier properties in epitaxial graphene (EG) with different number of layers grown by high-temperature sublimation on 4H-SiC(0001). We find that one monolayer (ML) EG possesses p-type conductivity with a free hole concentration in the low 1012 cmᅵᅵᅵ2 range and a free hole mobility parameter as high as 1550 cm2/Vs. We also find that 6 ML EG shows n-type doping behavior with a much lower free electron mobility parameter of 470 cm2/Vs and an order of magnitude higher free electron density in the low 1013 cmᅵᅵᅵ2 range. The observed differences are discussed. The cavity-enhanced THz optical Hall effect is demonstrated to be an excellent tool for contactless access to the type of free charge carriers and their properties in two-dimensional materials such as EG.

    Place, publisher, year, edition, pages
    Elsevier, 2017
    Keyword
    THz optical Hall effect, Epitaxial graphene, Free charge carrier properties
    National Category
    Physical Sciences Condensed Matter Physics Atom and Molecular Physics and Optics Ceramics
    Identifiers
    urn:nbn:se:liu:diva-132407 (URN)10.1016/j.apsusc.2016.10.023 (DOI)000408756700015 ()
    Note

    Funding agencies: Swedish Research Council (VR) [2013-5580]; Swedish Governmental Agency for Innovation Systems (VINNOVA) under the VINNMER international qualification program [2011-03486, 2014-04712]; Swedish foundation for strategic research (SSF) [FFL12-0181, RIF14-055]

    Available from: 2016-11-09 Created: 2016-11-09 Last updated: 2018-01-12Bibliographically approved
    2. Properties of two-dimensional electron gas in AlGaN/GaN HEMT structures determined by cavity-enhanced THz optical Hall effect
    Open this publication in new window or tab >>Properties of two-dimensional electron gas in AlGaN/GaN HEMT structures determined by cavity-enhanced THz optical Hall effect
    Show others...
    2016 (English)In: Physica Status Solidi C-Current Topics in Solid State Physics, Vol 13 No 5-6, Wiley-VCH Verlagsgesellschaft, 2016, Vol. 13, no 5-6, 369-373 p.Conference paper, Published paper (Refereed)
    Abstract [en]

    In this work we employ terahertz (THz) ellipsometry to determine two-dimensional electron gas (2DEG) density, mobility and effective mass in AlGaN/GaN high electron mobility transistor structures grown on 4H-SiC substrates. The effect of the GaN interface exposure to low-flow-rate trimethylaluminum (TMA) on the 2DEG properties is studied. The 2DEG effective mass and sheet density are determined tobe in the range of 0.30-0.32m0 and 4.3-5.5×1012 cm–2, respectively. The 2DEG effective mass parameters are found to be higher than the bulk effective mass of GaN, which is discussed in view of 2DEG confinement. It is shown that exposure to TMA flow improves the 2DEG mobility from 2000 cm2/Vs to values above 2200 cm2/Vs. A record mobility of 2332±61 cm2/Vs is determined for the sample with GaN interface exposed to TMA for 30 s. This improvement in mobility is suggested to be due to AlGaN/GaN interface sharpening causing the reduction of interface roughness scattering of electrons in the 2DEG.

    Place, publisher, year, edition, pages
    Wiley-VCH Verlagsgesellschaft, 2016
    Series
    Physica Status Solidi C-Current Topics in Solid State Physics, ISSN 1862-6351
    Keyword
    AlGaN/GaN HEMTs, THz ellipsometry, 2DEG properties, THz optical Hall effect
    National Category
    Condensed Matter Physics
    Identifiers
    urn:nbn:se:liu:diva-133135 (URN)10.1002/pssc.201510214 (DOI)000387957200045 ()
    Conference
    11th International Conference on Nitride Semiconductors (ICNS), Beijing, China, August 30-September 4. 2015
    Available from: 2016-12-12 Created: 2016-12-09 Last updated: 2017-10-23Bibliographically approved
  • 41.
    Armakavicius, Nerijus
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Bouhafs, Chamseddine
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Stanishev, Vallery
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Kühne, Philipp
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Yakimova, Rositsa
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Knight, Sean
    Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, USA.
    Hofmann, Tino
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering. Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, USA / Department of Physics and Optical Science, University of North Carolina at Charlotte, USA.
    Schubert, Mathias
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering. Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, USA.
    Darakchieva, Vanya
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Cavity-enhanced optical Hall effect in epitaxial graphene detected at terahertz frequencies2017In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 421, 357-360 p.Article in journal (Refereed)
    Abstract [en]

    Cavity-enhanced optical Hall effect at terahertz (THz) frequencies is employed to determine the free charge carrier properties in epitaxial graphene (EG) with different number of layers grown by high-temperature sublimation on 4H-SiC(0001). We find that one monolayer (ML) EG possesses p-type conductivity with a free hole concentration in the low 1012 cmᅵᅵᅵ2 range and a free hole mobility parameter as high as 1550 cm2/Vs. We also find that 6 ML EG shows n-type doping behavior with a much lower free electron mobility parameter of 470 cm2/Vs and an order of magnitude higher free electron density in the low 1013 cmᅵᅵᅵ2 range. The observed differences are discussed. The cavity-enhanced THz optical Hall effect is demonstrated to be an excellent tool for contactless access to the type of free charge carriers and their properties in two-dimensional materials such as EG.

  • 42.
    Armakavicius, Nerijus
    et al.
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Chen, Jr-Tai
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Hofmann, Tino
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering. Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, USA.
    Knight, Sean
    Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, USA.
    Kuhne, Philipp
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Nilsson, Daniel
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Forsberg, Urban
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Janzén, Erik
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Darakchieva, Vanya
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, Faculty of Science & Engineering.
    Properties of two-dimensional electron gas in AlGaN/GaN HEMT structures determined by cavity-enhanced THz optical Hall effect2016In: Physica Status Solidi C-Current Topics in Solid State Physics, Vol 13 No 5-6, Wiley-VCH Verlagsgesellschaft, 2016, Vol. 13, no 5-6, 369-373 p.Conference paper (Refereed)
    Abstract [en]

    In this work we employ terahertz (THz) ellipsometry to determine two-dimensional electron gas (2DEG) density, mobility and effective mass in AlGaN/GaN high electron mobility transistor structures grown on 4H-SiC substrates. The effect of the GaN interface exposure to low-flow-rate trimethylaluminum (TMA) on the 2DEG properties is studied. The 2DEG effective mass and sheet density are determined tobe in the range of 0.30-0.32m0 and 4.3-5.5×1012 cm–2, respectively. The 2DEG effective mass parameters are found to be higher than the bulk effective mass of GaN, which is discussed in view of 2DEG confinement. It is shown that exposure to TMA flow improves the 2DEG mobility from 2000 cm2/Vs to values above 2200 cm2/Vs. A record mobility of 2332±61 cm2/Vs is determined for the sample with GaN interface exposed to TMA for 30 s. This improvement in mobility is suggested to be due to AlGaN/GaN interface sharpening causing the reduction of interface roughness scattering of electrons in the 2DEG.

  • 43. Arnaudov, B.
    et al.
    Paskov, Plamen
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Harati Zadeh, Hamid
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
    Holtz, Per-Olof
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Monemar, Bo
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Kamiyama, S.
    Iwaya, M.
    Amano, H.
    Akasaki, I.
    Radiative recombination mechanism in highly modulation doped GaN/AlGaN multiple quantum wells2006In: Physica Status Solidi. C, Current topics in solid state physics, ISSN 1610-1634, E-ISSN 1610-1642, Vol. 6, 1888-1891 p.Article in journal (Refereed)
  • 44. Arnaudov, B.
    et al.
    Paskova, T.
    Evtimova, S.
    Monemar, Bo
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Lu, H.
    Schaff, W.J.
    Electron concentration and mobility profiles in InN layers grown by MBE2006Article in journal (Refereed)
    Abstract [en]

    We have studied depth distributions of the electrical parameters in MBE grown InN films with two types of AlN and GaN buffers. Using independently determined Hall effect electron concentration and mobility profiles, as well as electron concentration profile by photoluminescence measurements, we model the real depth profile of carrier mobility, assuming graded inhomogeneity of the sample. The obtained profiles follow power dependences of the same order for layers grown on the two buffers with a small difference in the function coefficients attributed to a contribution of the interface charge in layers grown on AlN buffers. © 2006 WILEY-VCH Verlag GmbH & Co. KGaA.

  • 45. Arnaudov, B
    et al.
    Paskova, Tanja
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
    Evtimova, S
    Heuken, M
    Monemar, Bo
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Hall effect data analysis of GaN n(+)n structures2002In: Physica status solidi. B, Basic research, ISSN 0370-1972, E-ISSN 1521-3951, Vol. 234, no 3, 872-876 p.Article in journal (Refereed)
    Abstract [en]

    We develop a model for analysis of Hall effect data of GaN structures composed of sublayers with different thicknesses and contacts placed on the top surface, We analysed the contributions of the conductivity of every sublayer of a planar sample taking into account the fact that the sample sublayers are partially connected in parallel to each other by series resistances formed in areas lying below the contacts from the upper layer. Correction factors, which reduce the contribution of the underlying layers to the measured whole sample conductivity, are obtained from the equations relevant to the respective equivalent circuit.

  • 46. Arnaudov, B
    et al.
    Paskova, Tanja
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
    Evtimova, S
    Valcheva, E
    Heuken, M
    Monemar, Bo
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Multilayer model for Hall effect data analysis of semiconductor structures with step-changed conductivity2003In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 67, no 4Article in journal (Refereed)
    Abstract [en]

    We present a multilayer model for analysis of Hall effect data of semiconductor structures composed of sublayers with different thicknesses and contacts placed on the top surface. Based on the circuit theory we analyze the contributions of the conductivity of every sublayer and derive general expressions for the conductivity and carrier mobility of a multilayer planar sample. The circuit analysis is performed taking into account the fact that the sample sublayers are partially connected in parallel to each other by series resistances formed in areas lying below the contacts from each upper layer. In order to solve the inverse problem of determining the electrical parameters of one of the sublayers, a procedure for analysis of the Hall effect data is proposed. The model is simplified for a structure composed of two layers with the same type of conductivity, and is used to determine the electrical parameters of GaN films grown on relatively thick GaN buffers.

  • 47.
    Arnaudov, B
    et al.
    Faculty of Physics, Sofia University, Sofia, Bulgaria.
    Paskova, Tanja
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Goldys, EM
    Semiconductor Science and Technology Laboratories, Macquarie University, Sydney, Australia.
    Evtimova, S
    Faculty of Physics, Sofia University, Sofia, Bulgaria.
    Monemar, Bo
    Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
    Modeling of the free-electron recombination band in emission spectra of highly conducting n-GaN2001In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 64, no 4Article in journal (Refereed)
    Abstract [en]

    We simulate the spectral distribution of the free-electron recombination band in optical emission spectra of GaN with a free-carrier concentration in the range of 5 x 10(17)-1 x 10(20) cm(-3). The influence of several factors, such as nonparabolicity, electron-electron interaction. and electron-impurity interaction on both the spectral and energy position and the effective gap narrowing are taken into account. The calculated properties of the free-electron-related emission bands are used to interpret the experimental photoluminescence and cathodoluminescence spectra of GaN epitaxial layers.

  • 48. Arnaudov, B.
    et al.
    Paskova, Tanja
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Paskov, Plamen
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Magnusson, Björn
    Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
    Monemar, Bo
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials.
    Lu, H.
    Schaff, W.J.
    On the nature of the near bandedge luminescence of InN epitaxial layers2005In: AIP Conference Proceedings, ISSN 0094-243X, E-ISSN 1551-7616, Vol. 772, 285-286 p.Article in journal (Refereed)
  • 49. Arnaudov, B
    et al.
    Paskova, Tanja
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
    Paskov, Plamen
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Magnusson, Björn
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Valcheva, E
    Monemar, Bo
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Lu, H
    Schaff, WJ
    Amano, H
    Akasaki, I
    Energy position of near-band-edge emission spectra of InN epitaxial layers with different doping levels2004In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 69, no 11Article in journal (Refereed)
    Abstract [en]

    We studied the shape and energy position of near-band-edge photoluminescence spectra of InN epitaxial layers with different doping levels. We found that the experimental spectra of InN layers with moderate doping level can be nicely interpreted in the frames of the "free-to-bound" recombination model in degenerate semiconductors. For carrier concentrations above n>5x10(18) cm(-3) the emission spectra can also be modeled satisfactorily, but a contribution due to a pushing up of nonequilibrium holes over the thermal delocalization level in the valence band tails should be considered in the model. The emission spectra of samples with low doping level were instead explained as a recombination from the bottom of the conduction band to a shallow acceptor assuming the same value of the acceptor binding energy estimated from the spectra of highly doped samples. Analyzing the shape and energy position of the free-electron recombination spectra we determined the carrier concentrations responsible for the emissions and found that the fundamental band gap energy of InN is E-g=692+/-2 meV for an effective mass at the conduction-band minimum m(n0)=0.042m(0).

  • 50.
    Arnaudov, B.
    et al.
    Faculty of Physics, Sofia University, 5 J. Bourchier Blvd, 1164 Sofia, Bulgaria.
    Paskova, Tanja
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
    Paskov, Plamen
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Magnusson, Björn
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Valcheva, E.
    Faculty of Physics, Sofia University, 5 J. Bourchier Blvd, 1164 Sofia, Bulgaria.
    Monemar, Bo
    Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
    Lu, H.
    Department of Electrical Engineering, Cornell University, Ithaka, NY 14583, United States.
    Schaff, W.J.
    Department of Electrical Engineering, Cornell University, Ithaka, NY 14583, United States.
    Amano, H.
    Department of Electrical Engineering, Meijo University, I-501 Shiogamaguchi, Tempaku-ku, Nagoia 468, Japan.
    Akasaki, I.
    Department of Electrical Engineering, Meijo University, I-501 Shiogamaguchi, Tempaku-ku, Nagoia 468, Japan.
    Free-to-bound radiative recombination in highly conducting InN epitaxial layers2004In: Superlattices and Microstructures, ISSN 0749-6036, E-ISSN 1096-3677, Vol. 36, no 4-6, 563-571 p.Article in journal (Refereed)
    Abstract [en]

    We present a theoretical simulation of near-band-edge emission spectra of highly conducting n-InN assuming the model of 'free-to-bound' radiative recombination (FBRR) of degenerate electrons from the conduction band with nonequilibrium holes located in the valence band tails. We also study experimental photoluminescence (PL) spectra of highly conducting InN epitaxial layers grown by MBE and MOVPE with electron concentrations in the range (7.7 × 1017-6 × 1018) cm-3 and find that the energy positions and shape of the spectra depend on the impurity concentration. By modeling the experimental PL spectra of the InN layers we show that spectra can be nicely interpreted in the framework of the FBRR model with specific peculiarities for different doping levels. Analyzing simultaneously the shape and energy position of the InN emission spectra we determine the fundamental bandgap energy of InN to vary between Eg = 692 meV for effective mass mn0 = 0.042m0 and Eg =710 meV for mn0 = 0.1m0. © 2004 Elsevier Ltd. All rights reserved.

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