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2007 (English)In: Journal of Magnetism and Magnetic Materials, ISSN 0304-8853, E-ISSN 1873-4766, Vol. 312, no 2, p. 453-457Article in journal (Refereed) Published
Abstract [en]
La0.7Sr0.3MnO3 polycrystalline manganite thin films were grown on silicon (Si) substrates covered by SiOx amorphous native oxide. Curie temperatures of about 325 K were achieved for 70-nm-thick films. Strong room temperature XMCD signal was detected indicating high spin polarization at the surface. Cross-sectional TEM images show sharp interface between SiOx and manganite without signature of chemical reaction at the interface. Unusual sharp splitting of the manganite film was observed: on the top of a transition layer characterized by low crystalline order, a magnetically robust layer is formed. © 2007 Elsevier B.V. All rights reserved.
Keywords
Interface, Manganite, Spintronics
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-47955 (URN)10.1016/j.jmmm.2006.11.221 (DOI)
2009-10-112009-10-112017-12-13