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Operational Stability of Organic Field-Effect Transistors
Eindhoven University of Technology, Netherlands.
Eindhoven University of Technology, Netherlands.
Eindhoven University of Technology, Netherlands; Philips Research Labs, Netherlands.
Eindhoven University of Technology, Netherlands.ORCID-id: 0000-0002-7104-7127
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2012 (Engelska)Ingår i: Advanced Materials, ISSN 0935-9648, E-ISSN 1521-4095, Vol. 24, nr 9, s. 1146-1158Artikel i tidskrift (Refereegranskat) Published
Abstract [en]

Organic field-effect transistors (OFETs) are considered in technological applications for which low cost or mechanical flexibility are crucial factors. The environmental stability of the organic semiconductors used in OFETs has improved to a level that is now sufficient for commercialization. However, serious problems remain with the stability of OFETs under operation. The causes for this have remained elusive for many years. Surface potentiometry together with theoretical modeling provide new insights into the mechanisms limiting the operational stability. These indicate that redox reactions involving water are involved in an exchange of mobile charges in the semiconductor with protons in the gate dielectric. This mechanism elucidates the established key role of water and leads in a natural way to a universal stress function, describing the stretched exponential-like time dependence ubiquitously observed. Further study is needed to determine the generality of the mechanism and the role of other mechanisms.

Ort, förlag, år, upplaga, sidor
Wiley-VCH Verlag , 2012. Vol. 24, nr 9, s. 1146-1158
Nyckelord [en]
organic field-effect transistor; operational stability; charge trapping; surface potentiometry; redox reaction
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URN: urn:nbn:se:liu:diva-141450DOI: 10.1002/adma.201104580ISI: 000300714700001PubMedID: 22298508OAI: oai:DiVA.org:liu-141450DiVA, id: diva2:1145801
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Funding Agencies|Dutch Technology Foundation STW; applied science division of NWO; Ministry of Economic Affairs

Tillgänglig från: 2017-09-29 Skapad: 2017-09-29 Senast uppdaterad: 2017-10-06

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