Boron centers in 4H-SiCVisa övriga samt affilieringar
2001 (Engelska)Ingår i: Materials science Forum, Vols. 353-356, 2001, Vol. 353-356, s. 455-458Konferensbidrag, Publicerat paper (Refereegranskat)
Abstract [en]
The origin of the "deep boron related acceptor level" in SIC is subject to a lot of controversy. Based on ENDOR investigations, a B-Si+V-C model was suggested, while PL studies indicated the acceptor on the carbon sublattice. Our former ab initio LDA molecular cluster calculation showed that in the B-Si+V-C complex the carbon vacancy acts as the acceptor. Now, ah initio LDA supercell calculations have been carried out for boron-related complexes to calculate the occupation levels in 4H-SiC. It has been found that the 0/- level for the B-Si+V-C complex lies in the upper half of the gap, therefore it can be disregarded as the origin of the "deep boron-related acceptor level". Investigating other feasible boron-related complexes, B-Si+Si-C appears to be the best candidate.
Ort, förlag, år, upplaga, sidor
2001. Vol. 353-356, s. 455-458
Serie
Materials Science Forum, ISSN 1662-9752 ; 353-356
Nyckelord [en]
boron, intrinsic defects, occupancy level
Nationell ämneskategori
Teknik och teknologier
Identifikatorer
URN: urn:nbn:se:liu:diva-49273DOI: 10.4028/www.scientific.net/MSF.353-356.455OAI: oai:DiVA.org:liu-49273DiVA, id: diva2:270169
Konferens
ECSCRM 2000: 3rd European Conference on Silicon Carbide and Related Materials, 3-7 September 2000, Kloster Banz, Germany
2009-10-112009-10-112015-05-29