The direct and parameter-free measurement of anisotropic electrical resistivity of a magnetic M(n+1)AX(n) (MAX) phase film is presented. A multitip scanning tunneling microscope is used to carry out 4-probe transport measurements with variable probe spacing s. The observation of the crossover from the 3D regime for small s to the 2D regime for large s enables the determination of both in-plane and perpendicular-to-plane resistivities rho(ab) and rho(c). A (Cr0.5Mn0.5)(2)GaC MAX phase film shows a large anisotropy ratio rho(c)/rho(ab) = 525 +/- 49. This is a consequence of the complex bonding scheme of MAX phases with covalent M-X and metallic M-M bonds in the MX planes and predominately covalent, but weaker bonds between the MX and A planes. Published under license by AIP Publishing.