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XPS guide: Charge neutralization and binding energy referencing for insulating samples
Pacific Northwest Natl Lab, WA 99352 USA.
Phys Elect, MN 55317 USA.
Weizmann Inst Sci, Israel.
CSIRO Mfg, Australia.
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2020 (English)In: Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, ISSN 0734-2101, E-ISSN 1520-8559, Vol. 38, no 3Article in journal (Refereed) Published
Abstract [en]

This guide deals with methods to control surface charging during XPS analysis of insulating samples and approaches to extracting useful binding energy information. The guide summarizes the causes of surface charging, how to recognize when it occurs, approaches to minimize charge buildup, and methods used to adjust or correct XPS photoelectron binding energies when charge control systems are used. There are multiple ways to control surface charge buildup during XPS measurements, and examples of systems on advanced XPS instruments are described. There is no single, simple, and foolproof way to extract binding energies on insulating material, but advantages and limitations of several approaches are described. Because of the variety of approaches and limitations of each, it is critical for researchers to accurately describe the procedures that have been applied in research reports and publications.

Place, publisher, year, edition, pages
A V S AMER INST PHYSICS , 2020. Vol. 38, no 3
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:liu:diva-165938DOI: 10.1116/6.0000057ISI: 000529985800001OAI: oai:DiVA.org:liu-165938DiVA, id: diva2:1435126
Note

Funding Agencies|Swedish Research Council VRSwedish Research Council [2018-03957]; Carl Tryggers Stiftelse Contract [CTS 17:166]; DOE Office of Biological and Environmental ResearchUnited States Department of Energy (DOE)

Available from: 2020-06-04 Created: 2020-06-04 Last updated: 2020-06-04

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Greczynski, Grzegorz
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Thin Film PhysicsFaculty of Science & Engineering
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