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Characterization of the high harmonics source for the VUV ellipsometer at ELI Beamlines
Institute of Physics, Czech Academy of Science, Na Slovance 2, 18221 Prague, Czech Republic.
Institute of Photonics and Nanotechnologies, National Council for Research, Via Trasea 7, 35131 Padova, Italy.
Institute of Photonics and Nanotechnologies, National Council for Research, Via Trasea 7, 35131 Padova, Italy.
Institute of Physics, Czech Academy of Science, Na Slovance 2, 18221 Prague, Czech Republic.ORCID iD: 0000-0001-7344-1518
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2020 (English)In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, ISSN 2166-2746, E-ISSN 2166-2754, Journal of Vacuum Science & Technology B, Vol. 38, no 2Article in journal (Refereed) Published
Abstract [en]

In this paper, the authors present the characterization experiments of a 20 fs vacuum ultraviolet beam from a high harmonic generation source. The beam hits a silicon sample and passes a triple reflection gold polarizer located inside an ultrahigh vacuum chamber. The polarizer’s Malus curve was obtained; the total acquisition time for each point of the curve was 30 s. This aims to be the first vacuum ultraviolet time-resolved user station dedicated to ellipsometry. The high harmonic beam is generated by a 12 mJ, 1 kHz, 20 fs, in-house-developed laser and detected by a back-illuminated charge-coupled device. 

Place, publisher, year, edition, pages
American Institute of Physics (AIP), 2020. Vol. 38, no 2
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:liu:diva-174458DOI: 10.1116/1.5129674ISI: 000569100800006Scopus ID: 2-s2.0-85081098365OAI: oai:DiVA.org:liu-174458DiVA, id: diva2:1538708
Available from: 2021-03-21 Created: 2021-03-21 Last updated: 2021-12-29Bibliographically approved

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Richter, Steffen

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