Optimization of Magnetic Reference Layers in Neutron Reflectometry Experiments: A Bayesian Experimental Design Approach
2026 (English)Independent thesis Advanced level (degree of Master (Two Years)), 20 credits / 30 HE credits
Student thesis
Abstract [en]
Neutron reflectometry is used to probe thin films and buried interfaces, but the interpretation of reflectometry data is often limited by non-uniqueness, finite measurement range, noise, and weak contrast between the sample of interest and the surrounding layers. These difficulties are especially relevant for soft-matter and other low-SLD systems, where different sample configurations can produce similar reflectivity curves. Magnetic reference layers offer one way to improve such experiments by introducing spin-dependent contrast in polarized neutron reflectometry. The choice of reference material, reference-layer thickness, and capping layer is therefore an experimental design problem.
This thesis investigates magnetic reference layer design for polarized neutron reflectometry using both signal-based and Bayesian design criteria. A specular reflectometry solver is implemented using a layered scattering-length-density model, Parratt recursion, and roughness corrections. The solver is embedded in a computational pipeline in which candidate designs are generated, simulated, scored, and optimized. Signal-based figures of merit, especially the total sensitivity figure, are compared with Bayesian objectives based on mutual information and posterior uncertainty reduction under a finite prior over possible samples of interest.
The results show that magnetic reference layer optimization depends on the chosen notion of informativeness. Signal sensitivity, posterior contraction, and polarization-specific information gain are related but not equivalent design criteria. The thesis therefore provides a simulation and optimization pipeline for MRL design and interprets MRL performance through the associated Bayesian inverse problem.
Place, publisher, year, edition, pages
2026. , p. 94
Keywords [en]
neutron reflectometry; polarized neutron reflectometry; magnetic reference layers; Bayesian experimental design; inverse problems; mutual information; numerical optimization; scattering length density; thin films
National Category
Condensed Matter Physics Other Mathematics
Identifiers
URN: urn:nbn:se:liu:diva-226351ISRN: LITH-IFM-A-EX--26/4894--SEOAI: oai:DiVA.org:liu-226351DiVA, id: diva2:2089856
Subject / course
Applied Mathematics
Presentation
2026-06-08, Kompakta Rummet, Campus Valla, Linköping, 10:00 (English)
Supervisors
Examiners
2026-08-052026-08-052026-08-05Bibliographically approved